Automatic test program generation: A case study

IEEE Design and Test of Computers

Volumn 21, Issue 2, 2004, Pages 102-109

  Corno, Fulvio ^a   Sánchez, Ernesto ^a   Reorda, Matteo Sonza ^a   Squillero, Giovanni ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER HARDWARE DESCRIPTION LANGUAGES; COMPUTER SIMULATION; DESIGN FOR TESTABILITY; GENETIC ALGORITHMS; OPTIMIZATION; PIPELINE PROCESSING SYSTEMS;

AUTOMATIC TEST PROGRAM; MICROPROCESSOR DESIGNS;

MICROPROCESSOR CHIPS;

EID: 1942532276     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2004.1277902     Document Type: Article

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