New technique for fast characterization of SILC distribution in flash arrays

IEEE International Reliability Physics Symposium Proceedings

Volumn 2001-January, Issue , 2001, Pages 73-80

  Ielmini, D ^a   Spinelli, A S ^b   Lacaita, A L ^a   Confalonieri, L ^c   Visconti, A ^c  

^a POLITECNICO DI MILANO   (Italy)

^b UNIVERSITY OF INSUBRIA   (Italy)

^c STMICROELECTRONICS   (Italy)

Author keywords

Channel hot electron injection; Dielectric substrates; Flash memory; Flash memory cells; Leakage current; Nonvolatile memory; Semiconductor device measurement; Statistical analysis; Statistical distributions; Testing

Indexed keywords

ELECTRON DEVICE TESTING; LEAKAGE CURRENTS; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; SEMICONDUCTOR DEVICE TESTING; SEMICONDUCTOR DEVICES; STATISTICAL METHODS; TESTING;

CHANNEL HOT ELECTRON INJECTION; DIELECTRIC SUBSTRATES; FLASH MEMORY CELL; NON-VOLATILE MEMORY; SEMICONDUCTOR DEVICE MEASUREMENTS; STATISTICAL DISTRIBUTION;

FLASH MEMORY;

EID: 3142687619     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2001.922885     Document Type: Conference Paper

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