Fast-bit-limited lifetime modeling of advanced floating gate non-volatile memories

International Integrated Reliability Workshop Final Report

Volumn , Issue , 2000, Pages 24-28

  Scarpa, A ^a   Tao, G ^a   Dijkstra, J ^a   Kuper, F G ^a  

^a NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; GATES (TRANSISTOR); LEAKAGE CURRENTS; RELIABILITY THEORY; SEMICONDUCTOR DEVICE TESTING; STATISTICAL METHODS;

FLOATING GATE NON-VOLATILE MEMORIES;

NONVOLATILE STORAGE;

EID: 0034430319     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)