Monte Carlo simulation of stress-induced leakage current by hopping conduction via multi-traps in oxide

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1998, Pages 905-908

  Okuyama, Yutaka ^a   Kamohara, Shiro ^a   Manabe, Yukiko ^a   Okuyama, Kousuke ^a   Kubota, Katsuhiko ^a   Kobayashi, Takashi ^a   Kimura, Katsutaka ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC FIELD EFFECTS; ELECTRODES; LEAKAGE CURRENTS; MONTE CARLO METHODS; THERMAL EFFECTS;

ELECTRON HOPPING; STRESS-INDUCED LEAKAGE CURRENTS (SILC);

ELECTRON TRAPS;

EID: 0032257713     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)