SCOPUS 정보 검색 플랫폼

Volumn 48, Issue 1, 1999, Pages 403-410

Reliability of thin dielectric for non-volatile applications

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC FILMS; FAILURE ANALYSIS; LEAKAGE CURRENTS; NONVOLATILE STORAGE; PROM; RELIABILITY; THIN FILMS;

ELECTRICALLY ERASABLE PROGRAMMABLE READ ONLY MEMORY (EEPROM); FLASH MEMORY; PROGRAM/ERASE CYCLING EFFECT;

MICROELECTRONICS;

EID: 0033190134 PISSN: 01679317 EISSN: None Source Type: Journal
DOI: 10.1016/S0167-9317(99)00414-1 Document Type: Article

Times cited : (39)

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