SCOPUS 정보 검색 플랫폼

Ultramicroscopy

Volumn 106, Issue 3, 2006, Pages 191-199

Nanoscale electrical characterization of semiconducting polymer blends by conductive atomic force microscopy (C-AFM)

(3) Alexeev, A a,b Loos, J a,d Koetse, M M c,d

a EINDHOVEN UNIVERSITY OF TECHNOLOGY (Netherlands)

b NT MDT (Russian Federation)

c TNO (Netherlands)

d DUTCH POLYMER INSTITUTE DPI (Netherlands)

Author keywords

Conductive atomic force microscopy; Current imaging spectroscopy; Semiconducting polymer blend

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC PROPERTIES; PHOTOVOLTAIC CELLS; SEMICONDUCTOR MATERIALS; SPECTROSCOPIC ANALYSIS;

CONDUCTIVE ATOMIC FORCE MICROSCOPY; CURRENT IMAGING SPECTROSCOPY; SEMICONDUCTING POLYMER BLEND;

POLYMER BLENDS;

POLYMER;

ARTICLE; ATOMIC FORCE MICROSCOPY; CONDUCTIVE ATOMIC FORCE MICROSCOPY; ELECTRIC CURRENT; ELECTRIC POTENTIAL; MORPHOLOGY; PHASE SEPARATION; SEMICONDUCTOR; SPECTROSCOPY; SURFACE PROPERTY; TOPOGRAPHY;

EID: 29244461471 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/j.ultramic.2005.07.003 Document Type: Article

Times cited : (106)

References (32)

1
- 0035242270
- C.J. Brabec, N.S. Sariciftci, and J.C. Hummelen Adv. Funct. Mater. 11 2001 15
- (2001) Adv. Funct. Mater. , vol.11 , pp. 15
- Brabec, C.J.¹ Sariciftci, N.S.² Hummelen, J.C.³

2
- 2942592582
- S.C. Veenstra, W.J.H. Verhees, J.M. Kroon, M.M. Koetse, J. Sweelssen, J.J.A.M. Bastiaansen, H.F.M. Schoo, X. Yang, A. Alexeev, J. Loos, U.S. Schubert, and M.M. Wienk Chem. Mater. 16 2004 2503
- (2004) Chem. Mater. , vol.16 , pp. 2503
- Veenstra, S.C.¹ Verhees, W.J.H.² Kroon, J.M.³ Koetse, M.M.⁴ Sweelssen, J.⁵ Bastiaansen, J.J.A.M.⁶ Schoo, H.F.M.⁷ Yang, X.⁸ Alexeev, A.⁹ Loos, J.¹⁰ Schubert, U.S.¹¹ Wienk, M.M.¹²

3
- 4143073461
- H. Hoppe, M. Niggemann, C. Winder, J. Kraut, R. Hiesgen, A. Hinsch, D. Meissner, and N.S. Sariciftci Adv. Funct. Mater. 14 2004 1005
- (2004) Adv. Funct. Mater. , vol.14 , pp. 1005
- Hoppe, H.¹ Niggemann, M.² Winder, C.³ Kraut, J.⁴ Hiesgen, R.⁵ Hinsch, A.⁶ Meissner, D.⁷ Sariciftci, N.S.⁸

4
- 0037425303
- N. Koch, A. Elschner, J. Schwartz, and A. Kahn Appl. Phys. Lett. 82 2003 2281
- (2003) Appl. Phys. Lett. , vol.82 , pp. 2281
- Koch, N.¹ Elschner, A.² Schwartz, J.³ Kahn, A.⁴

5
- 84874490698
- submitted.
- J. Loos, X. Yang, M. M. Koetse, J. Sweelssen, H.F.M. Schoo, S.C. Veenstra, W. Grogger, G. Kothleitner, F. Hofer, Adv. Funct. Mater. submitted.
- Adv. Funct. Mater.
- Loos, J.¹ Yang, X.² Koetse, M.M.³ Sweelssen, J.⁴ Schoo, H.F.M.⁵ Veenstra, S.C.⁶ Grogger, W.⁷ Kothleitner, G.⁸ Hofer, F.⁹

6
- 0001456384
- S.F. Alvarado, W. Rieβ, P.F. Seidler, and P. Strohriegl Phys. Rev. B 56 1997 1269
- (1997) Phys. Rev. B , vol.56 , pp. 1269
- Alvarado, S.F.¹ Rie, W.² Seidler, P.F.³ Strohriegl, P.⁴

7
- 0035099769
- R. Rinaldi, R. Cingolani, K.M. Jones, A.A. Baski, H. Morkoc, A. Di Carlo, J. Widany, F. Della Sala, and P. Lugli Phys. Rev. B 63 2001 075311
- (2001) Phys. Rev. B , vol.63 , pp. 075311
- Rinaldi, R.¹ Cingolani, R.² Jones, K.M.³ Baski, A.A.⁴ Morkoc, H.⁵ Di Carlo, A.⁶ Widany, J.⁷ Della Sala, F.⁸ Lugli, P.⁹

8
- 37649029996
- M. Kemerink, S.F. Alvarado, P. Müller, P.M. Koenraad, H.W.M. Salemink, J.H. Wolter, and R.A.J. Janssen Phys. Rev. B 70 2004 045202
- (2004) Phys. Rev. B , vol.70 , pp. 045202
- Kemerink, M.¹ Alvarado, S.F.² Müller, P.³ Koenraad, P.M.⁴ Salemink, H.W.M.⁵ Wolter, J.H.⁶ Janssen, R.A.J.⁷

9
- 0034818402
- T. Huser, and M. Yan Synth. Met. 116 2001 333
- (2001) Synth. Met. , vol.116 , pp. 333
- Huser, T.¹ Yan, M.²

10
- 1442275479
- C.R. McNeill, H. Frohne, J.L. Holdsworth, J.E. Furst, B.V. King, and P.C. Dastoor Nano Lett. 4 2004 219
- (2004) Nano Lett. , vol.4 , pp. 219
- McNeill, C.R.¹ Frohne, H.² Holdsworth, J.L.³ Furst, J.E.⁴ King, B.V.⁵ Dastoor, P.C.⁶

11
- 10844229560
- C.R. McNeill, H. Frohne, J.L. Holdsworth, and P.C. Dastoor Nano Lett. 4 2004 2503
- (2004) Nano Lett. , vol.4 , pp. 2503
- McNeill, C.R.¹ Frohne, H.² Holdsworth, J.L.³ Dastoor, P.C.⁴

12
- 36449005867
- C. Shafai, D.J. Thomson, M. Simard-Normandin, G. Mattiussi, and P.J. Scanlon Appl. Phys. Lett. 64 1994 342
- (1994) Appl. Phys. Lett. , vol.64 , pp. 342
- Shafai, C.¹ Thomson, D.J.² Simard-Normandin, M.³ Mattiussi, G.⁴ Scanlon, P.J.⁵

13
- 36448998615
- P. De Wolf, J. Snauwaert, T. Clarysse, W. Vandervorst, and L. Hellemans Appl. Phys. Lett. 66 1995 1530
- (1995) Appl. Phys. Lett. , vol.66 , pp. 1530
- De Wolf, P.¹ Snauwaert, J.² Clarysse, T.³ Vandervorst, W.⁴ Hellemans, L.⁵

14
- 11644297576
- P. De Wolf, T. Clarysse, W. Vandervorst, L. Hellemans, Ph. Niedermann, and W. Hänni J. Vac. Sci. Technol. B 16 1998 355
- (1998) J. Vac. Sci. Technol. B , vol.16 , pp. 355
- De Wolf, P.¹ Clarysse, T.² Vandervorst, W.³ Hellemans, L.⁴ Niedermann, Ph.⁵ Hänni, W.⁶

15
- 0033683036
- P. De Wolf, W. Vandervorst, H. Smith, and N. Khalil J. Vac. Sci. Technol. B 18 2000 540
- (2000) J. Vac. Sci. Technol. B , vol.18 , pp. 540
- De Wolf, P.¹ Vandervorst, W.² Smith, H.³ Khalil, N.⁴

16
- 0035535372
- R.P. Lu, K.L. Kavanagh, St.J. Dixon-Warren, A. Kuhl, A.J. SpringThorpe, E. Griswold, G. Hillier, I. Calder, R. Arès, and R. Streater J. Vac. Sci. Technol. B 19 2001 1662
- (2001) J. Vac. Sci. Technol. B , vol.19 , pp. 1662
- Lu, R.P.¹ Kavanagh, K.L.² Dixon-Warren, St.J.³ Kuhl, A.⁴ Springthorpe, A.J.⁵ Griswold, E.⁶ Hillier, G.⁷ Calder, I.⁸ Arès, R.⁹ Streater, R.¹⁰

17
- 0035982601
- R.P. Lu, K.L. Kavanagh, St.J. Dixon-Warren, A.J. SpringThorpe, R. Streater, and I. Calder J. Vac. Sci. Technol. B 20 2002 1682
- (2002) J. Vac. Sci. Technol. B , vol.20 , pp. 1682
- Lu, R.P.¹ Kavanagh, K.L.² Dixon-Warren, St.J.³ Springthorpe, A.J.⁴ Streater, R.⁵ Calder, I.⁶

18
- 0036124863
- P. Eyben, M. Xu, N. Duhayon, T. Clarysse, S. Callewaert, and W. Vandervorst J. Vac. Sci. Technol. B 20 2002 471
- (2002) J. Vac. Sci. Technol. B , vol.20 , pp. 471
- Eyben, P.¹ Xu, M.² Duhayon, N.³ Clarysse, T.⁴ Callewaert, S.⁵ Vandervorst, W.⁶

19
- 0036026395
- D. Ban, E.H. Sargent, St.J. Dixon-Warren, T. Grevatt, G. Knight, G. Pakulski, A.J. SpringThorpe, R. Streater, and J.K. White J. Vac. Sci. Technol. B 20 2002 2126
- (2002) J. Vac. Sci. Technol. B , vol.20 , pp. 2126
- Ban, D.¹ Sargent, E.H.² Dixon-Warren, St.J.³ Grevatt, T.⁴ Knight, G.⁵ Pakulski, G.⁶ Springthorpe, A.J.⁷ Streater, R.⁸ White, J.K.⁹

20
- 0037164788
- D. Ban, E.H. Sargent, St.J. Dixon-Warren, I. Calder, A.J. SpringThorpe, R. Dworschak, G. Este, and J.K. White Appl. Phys. Lett. 81 2002 5057
- (2002) Appl. Phys. Lett. , vol.81 , pp. 5057
- Ban, D.¹ Sargent, E.H.² Dixon-Warren, St.J.³ Calder, I.⁴ Springthorpe, A.J.⁵ Dworschak, R.⁶ Este, G.⁷ White, J.K.⁸

21
- 0042012762
- P. Eyben, S. Denis, T. Clarysse, and W. Vandervorst Mater. Sci. Eng. B 102 2003 132
- (2003) Mater. Sci. Eng. B , vol.102 , pp. 132
- Eyben, P.¹ Denis, S.² Clarysse, T.³ Vandervorst, W.⁴

22
- 20644470103
- G. Leatherman, E.N. Durantini, D. Gust, T.A. Moore, A.L. Moore, S. Stone, Z. Zhou, P. Rez, Y.Z. Liu, and S.M. Lindsay J. Phys. Chem. B 103 1999 4006
- (1999) J. Phys. Chem. B , vol.103 , pp. 4006
- Leatherman, G.¹ Durantini, E.N.² Gust, D.³ Moore, T.A.⁴ Moore, A.L.⁵ Stone, S.⁶ Zhou, Z.⁷ Rez, P.⁸ Liu, Y.Z.⁹ Lindsay, S.M.¹⁰

23
- 0034156294
- T.W. Kelley, and C.D. Frisbie J. Vac. Sci. Technol. B 18 2000 632
- (2000) J. Vac. Sci. Technol. B , vol.18 , pp. 632
- Kelley, T.W.¹ Frisbie, C.D.²

24
- 0037194939
- X.D. Cui, A. Primak, X. Zarate, J. Tomfohr, O.F. Sankey, A.L. Moore, T.A. Moore, D. Gust, L.A. Nagahara, and S.M. Lindsay J. Phys. Chem. B 106 2002 8609
- (2002) J. Phys. Chem. B , vol.106 , pp. 8609
- Cui, X.D.¹ Primak, A.² Zarate, X.³ Tomfohr, J.⁴ Sankey, O.F.⁵ Moore, A.L.⁶ Moore, T.A.⁷ Gust, D.⁸ Nagahara, L.A.⁹ Lindsay, S.M.¹⁰

25
- 79956015763
- A.M. Rawlett, T.J. Hopson, L.A. Nagahara, R.K. Tsui, G.K. Ramachandran, and S.M. Lindsay Appl. Phys. Lett. 81 2002 3043
- (2002) Appl. Phys. Lett. , vol.81 , pp. 3043
- Rawlett, A.M.¹ Hopson, T.J.² Nagahara, L.A.³ Tsui, R.K.⁴ Ramachandran, G.K.⁵ Lindsay, S.M.⁶

26
- 0037149819
- D.J. Wold, R. Haag, M.A. Rampi, and C.D. Frisbie J. Phys. Chem. B 106 2002 2813
- (2002) J. Phys. Chem. B , vol.106 , pp. 2813
- Wold, D.J.¹ Haag, R.² Rampi, M.A.³ Frisbie, C.D.⁴

27
- 79956037631
- H.-N. Lin, H.-L. Lin, S.-S. Wang, L.-S. Yu, G.-Y. Perng, S.-A. Chen, and S.-H. Chen Appl. Phys. Lett. 81 2002 2572
- (2002) Appl. Phys. Lett. , vol.81 , pp. 2572
- Lin, H.-N.¹ Lin, H.-L.² Wang, S.-S.³ Yu, L.-S.⁴ Perng, G.-Y.⁵ Chen, S.-A.⁶ Chen, S.-H.⁷

28
- 0037462949
- R. Neffati, A. Alexeev, S. Saunin, J.C.M. Brokken-Zijp, D. Wouters, S. Schmatloch, U.S. Schubert, and J. Loos Macromol. Rapid Comm. 24 2003 113
- (2003) Macromol. Rapid Comm. , vol.24 , pp. 113
- Neffati, R.¹ Alexeev, A.² Saunin, S.³ Brokken-Zijp, J.C.M.⁴ Wouters, D.⁵ Schmatloch, S.⁶ Schubert, U.S.⁷ Loos, J.⁸

29
- 1342285006
- H.J. Lee, and S.-M. Park J. Phys. Chem. B 108 2004 1590
- (2004) J. Phys. Chem. B , vol.108 , pp. 1590
- Lee, H.J.¹ Park, S.-M.²

30
- 3242877127
- L.S.C. Pingree, M.C. Hersam, M.M. Kern, B.J. Scott, and T.J. Marks Appl. Phys. Lett. 85 2004 344
- (2004) Appl. Phys. Lett. , vol.85 , pp. 344
- Pingree, L.S.C.¹ Hersam, M.C.² Kern, M.M.³ Scott, B.J.⁴ Marks, T.J.⁵

31
- 9644254209
- M.E. Greene, C.R. Kinser, D.E. Kramer, L.S.C. Pingree, and M.C. Hersam Microsc. Res. Techn. 64 2004 415
- (2004) Microsc. Res. Techn. , vol.64 , pp. 415
- Greene, M.E.¹ Kinser, C.R.² Kramer, D.E.³ Pingree, L.S.C.⁴ Hersam, M.C.⁵

32
- 0033121032
- W.F. Heinz, and J.H. Hoh Trends Biotech 17 1999 143
- (1999) Trends Biotech , vol.17 , pp. 143
- Heinz, W.F.¹ Hoh, J.H.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.