Nanoscale charge transport in an electroluminescent polymer investigated by conducting atomic force microscopy

Applied Physics Letters

Volumn 81, Issue 14, 2002, Pages 2572-2574

  Lin, Heh Nan ^a   Lin, Hui Lien ^a   Wang, Shen Shen ^a   Yu, Liang Sheng ^a   Perng, Gung Yeong ^a   Chen, Show An ^a   Chen, Sy Hann ^b  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b National Science Council   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTING ATOMIC FORCE MICROSCOPY; CURRENT-VOLTAGE MEASUREMENTS; ELECTROLUMINESCENT POLYMERS; HOLE TRANSPORTS; NANO SCALE; ORDERS OF MAGNITUDE; POOLE-FRENKEL PLOTS; SPACE-CHARGE-LIMITED CURRENT; SPATIAL RESOLUTION;

ELECTRIC CONDUCTIVITY; ELECTROLUMINESCENCE; NANOTECHNOLOGY;

ATOMIC FORCE MICROSCOPY;

EID: 79956037631     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1509464     Document Type: Article

References (18)

1. R. H. Friend, R. W. Gymer, A. B. Holmes, J. H. Burroughes, R. N. Marks, C. Taliani, D. D. C. Bradley, D. A. Das Santos, J. L. Brédas, M. Lögdlund, and W. R. Salaneck, Nature (London) 397, 121 (1999). nat NATUAS 0028-0836
2. P. W. M. Blom, M. J. M. de Jong, and J. J. M. Vleggaar, Appl. Phys. Lett. 68, 3308 (1996). apl APPLAB 0003-6951
3. I. H. Campbell, D. L. Smith, C. J. Neef, and J. P. Ferraris, Appl. Phys. Lett. 74, 2809 (1999). apl APPLAB 0003-6951
4. P. W. M. Blom, M. J. M. de Jong, and M. G. van Munster, Phys. Rev. B 55, R656 (1997). prb PRBMDO 0163-1829
5. L. Bozano, S. A. Carter, J. C. Scott, G. G. Malliaras, and P. J. Brock, Appl. Phys. Lett. 74, 1132 (1999). apl APPLAB 0003-6951
6. R. Jakubiak, C. J. Collison, W. C. Wan, L. J. Rothberg, and B. R. Hsieh, J. Phys. Chem. A 103, 2394 (1999). afh JPCAFH 1089-5639
7. T.-Q. Nguyen, I. B. Martini, J. Liu, and B. J. Schwartz, J. Phys. Chem. B 104, 237 (2000). bfk JPCBFK 1089-5647
8. T. Huser and M. Yan, Synth. Met. 116, 333 (2001). sym SYMEDZ 0379-6779
9. P.-K. Wei, Y.-F. Lin, W. Fann, Y.-Z. Lee, and S.-A. Chen, Phys. Rev. B 63, 045417 (2001). prb PRBMDO 0163-1829
10. J. Teetsov and D. A. Vanden Bout, J. Phys. Chem. B 104, 9378 (2002).
11. H.-N. Lin, S.-H. Chen, G.-Y. Perng, and S.-A. Chen, J. Appl. Phys. 89, 3976 (2001). jap JAPIAU 0021-8979
12. 2=0.35 (for polymer), a is calculated to be around 8.3 nm.
13. J. H. Park, H. Y. Yu, J. G. Park, B. Kim, S. H. Lee, L. Olofsson, S. H. M. Persson, and Y. W. Park, Thin Solid Films 393, 129 (2001). tsf THSFAP 0040-6090
14. S. V. Rakhmanova and E. M. Conwell, Appl. Phys. Lett. 76, 3822 (2000). apl APPLAB 0003-6951
15. Å. Johansson and S. Stafström, Phys. Rev. Lett. 86, 3602 (2001). prl PRLTAO 0031-9007
16. D. M. Basko and E. M. Conwell, Phys. Rev. Lett. 88, 056401 (2002). prl PRLTAO 0031-9007
17. T.-W. Lee and O. O. Park, Appl. Phys. Lett. 77, 3334 (2000). apl APPLAB 0003-6951
18. D. Ma, J. M. Lupton, R. Beavington, P. L. Burn, and I. D. W. Samuel, J. Phys. D 35, 520 (2002). jpd JPAPBE 0022-3727