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Volumn 24, Issue 1, 2003, Pages 113-117
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Automated scanning probe microscopy as a new tool for combinatorial polymer research: Conductive carbon black/poly(dimethylsiloxane) composites
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Author keywords
Automated AFM; Carbon black nanocomposites; Combinatorial materials research; Conductivity; High throughput experimentation; Siloxane rubbers
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Indexed keywords
CARBON;
DIMETICONE;
POLYMER;
RUBBER;
ARTICLE;
AUTOMATION;
COMBINATORIAL CHEMISTRY;
COMPLEX FORMATION;
COMPOSITE MATERIAL;
CONCENTRATION (PARAMETERS);
CONDUCTANCE;
PHYSICAL CHEMISTRY;
SCANNING PROBE MICROSCOPY;
SURFACE PROPERTY;
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EID: 0037462949
PISSN: 10221336
EISSN: None
Source Type: Journal
DOI: 10.1002/marc.200390000 Document Type: Article |
Times cited : (22)
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References (18)
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