Latchup and the domino effect

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2005, Pages 145-156

  Voldman, Steven H ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

Cable Discharge Event; ESD; External Latchup; Single Event Latchup

Indexed keywords

EID: 28744436292     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (46)

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