Contention-induced latchup

IEEE International Reliability Physics Symposium Proceedings

Volumn 2004-January, Issue January, 2004, Pages 126-129

  Mechler, Jeanne Trinko ^a   Brennan, Ciaran ^a   Massucco, James ^a   Rossi, Ron ^a   Wissel, Larry ^a  

^a IBM   (United States)

Author keywords

Boundary Scan; External Latchup; I^{2< sup>C; IEEE 1149.1; JTAG; Latchup; SQUID}

Indexed keywords

CABLES; FAILURE ANALYSIS; INTEGRATED CIRCUIT DESIGN; OUTAGES; SQUIDS;

BOUNDARY SCAN; BOUNDARY-SCAN STRUCTURES; IEEE 1149.1; JTAG; LATCH-UPS; PHYSICAL FAILURE ANALYSIS; STANDARD PRODUCTS; TEST STRUCTURE DESIGN;

STRUCTURAL DESIGN;

EID: 84932109015     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2004.1315312     Document Type: Conference Paper

References (9)

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