Quantitative electrostatic force microscopy-phase measurements

Nanotechnology

Volumn 15, Issue 5, 2004, Pages 627-634

  Lei, C H ^a   Das, A ^a   Elliott, M ^a   Macdonald, J E ^a  

^a CARDIFF UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAPACITANCE MEASUREMENT; COULOMB BLOCKADE; ELECTRODES; ELECTROSTATICS; GOLD; MICROSCOPIC EXAMINATION; MORPHOLOGY; OPTICAL RESOLVING POWER; PERMITTIVITY; SEMICONDUCTING POLYMERS;

CHARGE POTENTIAL; COULOMB FORCE; ELECTROSTATIC FORCE MICROSCOPY; SCANNING PROBE MICROSCOPY;

PHASE MEASUREMENT;

EID: 2642565204     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/15/5/038     Document Type: Article

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