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Mikrochimica Acta

Volumn 132, Issue 2-4, 2000, Pages 449-455

Contact potential difference of Au and GaInAs by electrostatic force microscopy

(1) Bresse, Jean François a

a ORANGE LABS (France)

Author keywords

Atomic force microscopy; Contact potential difference; Electrostatic force microscopy

Indexed keywords

EID: 0004359339 PISSN: 00263672 EISSN: None Source Type: Journal
DOI: 10.1007/s006040050093 Document Type: Article

Times cited : (5)

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