Relationship between charge distribution and its image by electrostatic force microscopy

Journal of Applied Physics

Volumn 93, Issue 9, 2003, Pages 5369-5376

  Lambert, Jérôme ^a   Guthmann, Claudine ^a   Saint Jean, Michel ^a  

^a Groupe de Physique des Solides   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROSTATICS; IMAGING TECHNIQUES; MOLECULAR VIBRATIONS; OPTICAL MICROSCOPY; SCANNING; SURFACE TOPOGRAPHY;

CHARGE DISTRIBUTION; ELECTROSTATIC FORCE MICROSCOPY (EFM);

ELECTRIC CHARGE;

EID: 0037648828     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1559411     Document Type: Article

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