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Volumn 13, Issue 9, 2001, Pages 631-634
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Direct visualization of the nanoscale morphology of conducting polythiophene monolayers studied by electrostatic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
CONDUCTIVE PLASTICS;
ELECTRON TRANSPORT PROPERTIES;
ELECTRONIC PROPERTIES;
ELECTRONIC STRUCTURE;
ELECTROSTATICS;
LANGMUIR BLODGETT FILMS;
MICROSCOPIC EXAMINATION;
MORPHOLOGY;
THICKNESS MEASUREMENT;
X RAY DIFFRACTION ANALYSIS;
ELECTROSTATIC FORCE MICROSCOPY;
LANGMUIR-SCHAEFER TECHNIQUE;
POLYTHIOPHENE;
MONOLAYERS;
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EID: 0035799610
PISSN: 09359648
EISSN: None
Source Type: Journal
DOI: 10.1002/1521-4095(200105)13:9<631::AID-ADMA631>3.0.CO;2-F Document Type: Article |
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Times cited : (52)
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References (32)
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