Measurement of the contact potential difference with an electrostatic force microscope

European Journal of Physics

Volumn 22, Issue 6, 2001, Pages 657-662

  Rousier, R ^a   Vairac, P ^a   Cretin, B ^a  

^a FEMTO ST INSTITUTE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; ELECTROSTATIC DEVICES; IMAGE ANALYSIS; LASER APPLICATIONS; MICROSCOPES; OPTICAL RESOLVING POWER;

CONTACT POTENTIAL DIFFERENCE (CPD); ELECTROSTATIC FORCE MICROSCOPES;

SURFACE TOPOGRAPHY;

EID: 0035506067     PISSN: 01430807     EISSN: None     Source Type: Journal    
DOI: 10.1088/0143-0807/22/6/311     Document Type: Article

References (18)