-
1
-
-
0000618539
-
3-intrinsic quantum paraelectric below 4 K
-
3-Intrinsic Quantum Paraelectric Below 4 K," Phys. Rev. B, 19 [7] 3593-602 (1979).
-
(1979)
Phys. Rev. B
, vol.19
, Issue.7
, pp. 3593-3602
-
-
Muller, K.A.1
Burkard, H.2
-
2
-
-
4243506840
-
Temperature dependence of a transverse optic mode in strontium titanate
-
R. A. Cowley, "Temperature Dependence of a Transverse Optic Mode in Strontium Titanate," Phys. Rev. Lett., 9 [4] 159-61 (1962).
-
(1962)
Phys. Rev. Lett.
, vol.9
, Issue.4
, pp. 159-161
-
-
Cowley, R.A.1
-
5
-
-
4043117567
-
3
-
3," Nature. 430 [7001] 758-61 (2004).
-
(2004)
Nature
, vol.430
, Issue.7001
, pp. 758-761
-
-
Haeni, J.H.1
Irvin, P.2
Chang, W.3
Uecker, R.4
Reiche, P.5
Li, Y.L.6
Choudhury, S.7
Tian, W.8
Hawley, M.E.9
Craigo, B.10
Tagantsev, A.K.11
Pan, X.Q.12
Streiffer, S.K.13
Chen, L.Q.14
Kirchoefer, S.W.15
Levy, J.16
Schlom, D.G.17
-
6
-
-
0032607649
-
4
-
4," Appl. Phys. Lett., 74 [23] 3543-5 (1999).
-
(1999)
Appl. Phys. Lett.
, vol.74
, Issue.23
, pp. 3543-3545
-
-
Lippmaa, M.1
Nakagawa, N.2
Kawasaki, M.3
Ohashi, S.4
Inaguma, Y.5
Itoh, M.6
Koinuma, H.7
-
8
-
-
0002641527
-
Nonlinearity and microwave losses in cubic strontium-titanate
-
G. Rupprecht, R. O. Bell, and B. D. Silverman, "Nonlinearity and Microwave Losses in Cubic Strontium-Titanate," Phys. Rev., 123 [1] 97-8 (1961).
-
(1961)
Phys. Rev.
, vol.123
, Issue.1
, pp. 97-98
-
-
Rupprecht, G.1
Bell, R.O.2
Silverman, B.D.3
-
9
-
-
36849128687
-
Variation of dielectric constant with voltage in ferroelectrics and its application to parametric devices
-
K. M. Johnson, "Variation of Dielectric Constant with Voltage in Ferroelectrics and its Application to Parametric Devices," J. Appl. Phys., 33 [9] 2826-31
-
J. Appl. Phys.
, vol.33
, Issue.9
, pp. 2826-2831
-
-
Johnson, K.M.1
-
10
-
-
0006845444
-
Über das Mikrowellenverhalten Nichtlinearer Dielektrika
-
K. Bethe, "Über das Mikrowellenverhalten Nichtlinearer Dielektrika," Philips Res. Rep., [2 Suppl] 1-145 (1970).
-
(1970)
Philips Res. Rep.
, Issue.2 SUPPL.
, pp. 1-145
-
-
Bethe, K.1
-
11
-
-
1842484069
-
Ferroelectric materials for microwave tunable applications
-
A. K. Tagantsev, V. O. Sherman, K. F. Astafiev, J. Venkatesh, and N. Setter, "Ferroelectric Materials for Microwave Tunable Applications," J. Electroceram., 11 [1-2] 5-66 (2003).
-
(2003)
J. Electroceram.
, vol.11
, Issue.1-2
, pp. 5-66
-
-
Tagantsev, A.K.1
Sherman, V.O.2
Astafiev, K.F.3
Venkatesh, J.4
Setter, N.5
-
12
-
-
0031560358
-
3 thin films
-
3 Thin Films," Appl. Phys. Lett., 71 [23] 3353-5 (1997).
-
(1997)
Appl. Phys. Lett.
, vol.71
, Issue.23
, pp. 3353-3355
-
-
Hubert, C.1
Levy, J.2
Carter, A.C.3
Chang, W.4
Kiechoefer, S.W.5
Horwitz, J.S.6
Chrisey, D.B.7
-
13
-
-
0000231055
-
3+z. Thin films grown by chemical vapor deposition
-
3+z. Thin Films Grown by Chemical Vapor Deposition," J. Appl. Phys., 86 [8] 4565-75 (1999).
-
(1999)
J. Appl. Phys.
, vol.86
, Issue.8
, pp. 4565-4575
-
-
Streiffer, S.K.1
Baseeri, C.2
Parker, C.B.3
Lash, S.E.4
Kingon, A.I.5
-
15
-
-
36149011996
-
Dielectric constant in paraelectric perovskites
-
G. Rupprecht and R. O. Bell, "Dielectric Constant in Paraelectric Perovskites," Phys. Rev. A, 135 [3A] A748-A752 (1964).
-
(1964)
Phys. Rev. A
, vol.135
, Issue.3 A
-
-
Rupprecht, G.1
Bell, R.O.2
-
16
-
-
0015331538
-
Permittivity of strontium titanate
-
R. C. Neville, C. A. Mead, and B. Hoeneisen, "Permittivity of Strontium Titanate," J. Appl. Phys., 43 [5] 2124-31 (1972).
-
(1972)
J. Appl. Phys.
, vol.43
, Issue.5
, pp. 2124-2131
-
-
Neville, R.C.1
Mead, C.A.2
Hoeneisen, B.3
-
17
-
-
0001242004
-
3
-
3," Phys. Rev. B, 50 [1] 601-4 (1994).
-
(1994)
Phys. Rev. B
, vol.50
, Issue.1
, pp. 601-604
-
-
Viana, R.1
Lunkenheimer, P.2
Hornberger, J.3
Bohmer, R.4
Loidl, A.5
-
18
-
-
0014835618
-
Dielectric properties of strontium titanate at low temperature
-
M. A. Saifi and L. E. Cross, "Dielectric Properties of Strontium Titanate at Low Temperature," Phys. Rev. B, 2 [3] 677-84 (1970).
-
(1970)
Phys. Rev. B
, vol.2
, Issue.3
, pp. 677-684
-
-
Saifi, M.A.1
Cross, L.E.2
-
19
-
-
0033072640
-
Ferroelectric thin films grown on tensile substrates: Renormalizalion of the curie-weiss law and apparent absence of ferroelectricity
-
N. A. Pertsev, A. G. Zembilgotov, S. Hoffmann, R. Waser, and A. K. Tagantsev, "Ferroelectric Thin Films Grown on Tensile Substrates: Renormalizalion of the Curie-Weiss Law and Apparent Absence of Ferroelectricity," J. Appl. Phys., 85 [3] 1698-701 (1999).
-
(1999)
J. Appl. Phys.
, vol.85
, Issue.3
, pp. 1698-1701
-
-
Pertsev, N.A.1
Zembilgotov, A.G.2
Hoffmann, S.3
Waser, R.4
Tagantsev, A.K.5
-
20
-
-
0032606663
-
The effect of stress on the dielectric properties of barium strontium titanate thin films
-
T. M. Shaw, Z. Suo, M. Huang, E. Liniger, R. B. Laibowitz, and J. D. Baniecki, "The Effect of Stress on the Dielectric Properties of Barium Strontium Titanate Thin Films," Appl. Phys. Lett., 75 [14] 2129-31 (1999).
-
(1999)
Appl. Phys. Lett.
, vol.75
, Issue.14
, pp. 2129-2131
-
-
Shaw, T.M.1
Suo, Z.2
Huang, M.3
Liniger, E.4
Laibowitz, R.B.5
Baniecki, J.D.6
-
22
-
-
0141633746
-
Influence of stoichiometry on the dielectric properties of sputtered strontium titanate thin films
-
T. R. Taylor, P. J. Hansen, N. Pervez, B. Acikel, R. A. York, and J. S. Speck, "Influence of Stoichiometry on the Dielectric Properties of Sputtered Strontium Titanate Thin Films," J. Appl. Phys., 94 [5] 3390-6 (2003).
-
(2003)
J. Appl. Phys.
, vol.94
, Issue.5
, pp. 3390-3396
-
-
Taylor, T.R.1
Hansen, P.J.2
Pervez, N.3
Acikel, B.4
York, R.A.5
Speck, J.S.6
-
23
-
-
0034244461
-
Grain boundaries in barium strontium titanate thin films: Structure, chemistry and influence on electronic properties
-
S. Stemmer, S. K. Streiffer, N. D. Browning, C. Basceri, and A. I. Kingon, "Grain Boundaries in Barium Strontium Titanate Thin Films: Structure, Chemistry and Influence on Electronic Properties," Interface Sci., 8 [2-3] 209-21 (2000).
-
(2000)
Interface Sci.
, vol.8
, Issue.2-3
, pp. 209-221
-
-
Stemmer, S.1
Streiffer, S.K.2
Browning, N.D.3
Basceri, C.4
Kingon, A.I.5
-
24
-
-
0034704750
-
3 thin films
-
3 Thin Films," Nature, 404 [6776] 373-6 (2000).
-
(2000)
Nature
, vol.404
, Issue.6776
, pp. 373-376
-
-
Sirenko, A.A.1
Bernhard, C.2
Golnik, A.3
Clark, A.M.4
Hao, J.H.5
Si, W.D.6
Xi, X.X.7
-
25
-
-
0000589159
-
3 films
-
3 Films," Appl. Phys. Lett., 68 [4] 490-2 (1996).
-
(1996)
Appl. Phys. Lett.
, vol.68
, Issue.4
, pp. 490-492
-
-
Tarsa, E.J.1
Hachfeld, E.A.2
Quinlan, F.T.3
Speck, J.S.4
Eddy, M.5
-
26
-
-
0033874950
-
Interfaces and stresses in thin films
-
F. Spaepen, "Interfaces and Stresses in Thin Films," Acta Mater., 48 [1] 31-42 (2000).
-
(2000)
Acta Mater.
, vol.48
, Issue.1
, pp. 31-42
-
-
Spaepen, F.1
-
27
-
-
0001264799
-
Intrinsic dead layer effect and the performance of ferroelectric thin film capacitor
-
C. Zhou and D. M. Newns, "Intrinsic Dead Layer Effect and the Performance of Ferroelectric Thin Film Capacitor," J. Appl. Phys., 82 [6] 3081-8 (1997).
-
(1997)
J. Appl. Phys.
, vol.82
, Issue.6
, pp. 3081-3088
-
-
Zhou, C.1
Newns, D.M.2
-
29
-
-
0032623974
-
Electric-field penetration into metals: Conseqviences for high-dielectric-constant capacitors
-
C. T. Black and J. J. Welser, "Electric-Field Penetration into Metals: Conseqviences for High-Dielectric-Constant Capacitors," IEEE Trans. Electron Dev., 46 [4] 776-80 (1999).
-
(1999)
IEEE Trans. Electron Dev.
, vol.46
, Issue.4
, pp. 776-780
-
-
Black, C.T.1
Welser, J.J.2
-
31
-
-
0038410971
-
Models of electrode-dielectric interfaces in ferroelectric thin-film devices
-
M. Dawber and J. F. Scott, "Models of Electrode-Dielectric Interfaces in Ferroelectric Thin-film Devices," Jpn. J. Appl. Phys. Part 1, 41 [11B] 6848-51 (2002).
-
(2002)
Jpn. J. Appl. Phys. Part 1
, vol.41
, Issue.11 B
, pp. 6848-6851
-
-
Dawber, M.1
Scott, J.F.2
-
32
-
-
0036640583
-
3 thin films with Pt or conducting oxide electrodes
-
3 Thin Films with Pt or Conducting Oxide Electrodes," J. Appl. Phys., 92 [1] 432-7 (2002).
-
(2002)
J. Appl. Phys.
, vol.92
, Issue.1
, pp. 432-437
-
-
Hwang, C.S.1
-
33
-
-
0344946199
-
Investigation of the importance of interface and bulk limited transport mechanisms on the leakage current of high dielectric constant thin film capacitors
-
J. D. Baniecki, T. Shioga, K. Kurihara, and N. Kamehara, "Investigation of the Importance of Interface and Bulk Limited Transport Mechanisms on the Leakage Current of High Dielectric Constant Thin Film Capacitors," J. Appl. Phys., 94 [10] 6741-8 (2003).
-
(2003)
J. Appl. Phys.
, vol.94
, Issue.10
, pp. 6741-6748
-
-
Baniecki, J.D.1
Shioga, T.2
Kurihara, K.3
Kamehara, N.4
-
34
-
-
11744388456
-
Effect of mechanical boundary conditions on phase diagrams of epitaxial ferroelectric thin films
-
N. A. Pertsev, A. G. Zembilgolov, and A. K. Tagantsev, "Effect of Mechanical Boundary Conditions on Phase Diagrams of Epitaxial Ferroelectric Thin Films," Phys. Rev. Lett., 80 [9] 1988-91 (1998).
-
(1998)
Phys. Rev. Lett.
, vol.80
, Issue.9
, pp. 1988-1991
-
-
Pertsev, N.A.1
Zembilgolov, A.G.2
Tagantsev, A.K.3
-
35
-
-
0029776136
-
Thermodynamics of epitaxial ferroelectric films
-
S. B. Desu, V. P. Dudkevich, P. V. Dudkevich, I. N. Zakharchenko, and G. L. Kushlyan, "Thermodynamics of Epitaxial Ferroelectric Films," Mater. Res. Soc. Symp. Proc., 401, 195-201 (1996).
-
(1996)
Mater. Res. Soc. Symp. Proc.
, vol.401
, pp. 195-201
-
-
Desu, S.B.1
Dudkevich, V.P.2
Dudkevich, P.V.3
Zakharchenko, I.N.4
Kushlyan, G.L.5
-
36
-
-
79956056412
-
Impact of thermal strain on the dielectric constant of sputtered barium strontium titanate thin films
-
T. R. Taylor, P. J. Hansen, B. Acikel, N. Pervez, R. A. York, S. K. Streiffer, and J. S. Speck, "Impact of Thermal Strain on the Dielectric Constant of Sputtered Barium Strontium Titanate Thin Films," Appl. Phys. Lett., 80 [11] 1978-80 (2002).
-
(2002)
Appl. Phys. Lett.
, vol.80
, Issue.11
, pp. 1978-1980
-
-
Taylor, T.R.1
Hansen, P.J.2
Acikel, B.3
Pervez, N.4
York, R.A.5
Streiffer, S.K.6
Speck, J.S.7
-
37
-
-
4344677034
-
The role of thermally-induced internal stresses on the tunabilily of textured barium strontium titanate films
-
A. Sharma, Z. G. Ban, S. P. Alpay, and J. V. Mantese, "The Role of Thermally-Induced Internal Stresses on the Tunabilily of Textured Barium Strontium Titanate Films," Appl. Phys. Lett., 85 [6] 985-7 (2004).
-
(2004)
Appl. Phys. Lett.
, vol.85
, Issue.6
, pp. 985-987
-
-
Sharma, A.1
Ban, Z.G.2
Alpay, S.P.3
Mantese, J.V.4
-
38
-
-
0000655143
-
3, thin films
-
3, Thin Films," J. Appl. Phys., 87 [6] 3044-9 (2000).
-
(2000)
J. Appl. Phys.
, vol.87
, Issue.6
, pp. 3044-3049
-
-
Chang, W.T.1
Gilmore, C.M.2
Kim, W.J.3
Pond, J.M.4
Kirchoefer, S.W.5
Qadri, S.B.6
Chirsey, D.B.7
Horwitz, J.S.8
-
39
-
-
11144356585
-
Shift of phase transition temperature in strontium titanate thin films
-
K. Astafiev, V. Sherman, A. Tagantsev, N. Setter, P. Petrov, T. Kaydanova, D. Ginley, S. Hoffmann-Eifert, U. Bottger, and R. Waser, "Shift of Phase Transition Temperature in Strontium Titanate Thin Films," Integr. Ferroelectrics, 58, 1371-9 (2003).
-
(2003)
Integr. Ferroelectrics
, vol.58
, pp. 1371-1379
-
-
Astafiev, K.1
Sherman, V.2
Tagantsev, A.3
Setter, N.4
Petrov, P.5
Kaydanova, T.6
Ginley, D.7
Hoffmann-Eifert, S.8
Bottger, U.9
Waser, R.10
-
40
-
-
0036647978
-
3 thin films
-
3 Thin Films," IEEE Microwave Wireless Compon. Lett., 12 [7] 237-9 (2002).
-
(2002)
IEEE Microwave Wireless Compon. Lett.
, vol.12
, Issue.7
, pp. 237-239
-
-
Acikel, B.1
Taylor, T.R.2
Hansen, P.J.3
Speck, J.S.4
York, R.A.5
-
41
-
-
0242335952
-
Silicon substrate integrated high Q-factor parallel-plate ferroelectric varactors for micro-wave/millimeterwave applications
-
A. Vorobiev, P. Rundqvist, K. Khamchane, and S. Gevorgian, "Silicon Substrate Integrated High Q-Factor Parallel-Plate Ferroelectric Varactors for Micro-wave/Millimeterwave Applications," Appl. Phys. Lett., 83 [15] 3144-6 (2003).
-
(2003)
Appl. Phys. Lett.
, vol.83
, Issue.15
, pp. 3144-3146
-
-
Vorobiev, A.1
Rundqvist, P.2
Khamchane, K.3
Gevorgian, S.4
-
42
-
-
3142692038
-
3: Characterization of texture and nonstoichiometry accommodation
-
3: Characterization of Texture and Nonstoichiometry Accommodation," J. Mater. Res., 19 [5] 1477-86 (2004).
-
(2004)
J. Mater. Res.
, vol.19
, Issue.5
, pp. 1477-1486
-
-
Klenov, D.O.1
Taylor, T.R.2
Stemmer, S.3
-
43
-
-
0035413683
-
Microstructural study of epitaxial platinum and permalloy/platinum films grown on (0001) sapphire
-
S. Ramanathan, B. M. Clemens, P. C. McIntyre, and U. Dahmen, "Microstructural Study of Epitaxial Platinum and Permalloy/Platinum Films Grown on (0001) Sapphire," Philos. Mag. A, 81 [8] 2073-94 (2001).
-
(2001)
Philos. Mag. A
, vol.81
, Issue.8
, pp. 2073-2094
-
-
Ramanathan, S.1
Clemens, B.M.2
McIntyre, P.C.3
Dahmen, U.4
-
44
-
-
36449006903
-
Epitaxial-growth of iridium and platinum films on sapphire by metalorganic chemical-vapor-deposition
-
R. Vargas, T. Goto, W. Zhang, and T. Hirai, "Epitaxial-Growth of Iridium and Platinum Films on Sapphire by Metalorganic Chemical-Vapor- Deposition," Appl. Phys. Lett., 65 [9] 1094-6 (1994).
-
(1994)
Appl. Phys. Lett.
, vol.65
, Issue.9
, pp. 1094-1096
-
-
Vargas, R.1
Goto, T.2
Zhang, W.3
Hirai, T.4
-
45
-
-
0027678507
-
Epitaxial-growth of PI on basal-plane sapphire - A seed film for artificially layered magnetic metal structures
-
R. F. C. Farrow, G. R. Harp, R. F. Marks, T. A. Rabedeau, M. F. Toney, D. Weller, and S. S. P. Parkin, "Epitaxial-Growth of PI on Basal-Plane Sapphire - A Seed Film for Artificially Layered Magnetic Metal Structures," J. Cryst. Growth, 133 [1-2] 47-58 (1993).
-
(1993)
J. Cryst. Growth
, vol.133
, Issue.1-2
, pp. 47-58
-
-
Farrow, R.F.C.1
Harp, G.R.2
Marks, R.F.3
Rabedeau, T.A.4
Toney, M.F.5
Weller, D.6
Parkin, S.S.P.7
-
46
-
-
0036131739
-
Investigation of platinum films grown on sapphire (0001) by molecular beam epitaxy
-
H. Zhou, P. Wochner, A. Schops, and T. Wagner, "Investigation of Platinum Films Grown on Sapphire (0001) by Molecular Beam Epitaxy," J. Cryst. Growth, 234 [2-3] 561-8 (2002).
-
(2002)
J. Cryst. Growth
, vol.234
, Issue.2-3
, pp. 561-568
-
-
Zhou, H.1
Wochner, P.2
Schops, A.3
Wagner, T.4
-
47
-
-
27644529939
-
X-ray diffraction characterization of multilayer epitaxial thin films deposited on (0001) sapphire
-
T. N. Blanton and L.-S. Hung, "X-ray Diffraction Characterization of Multilayer Epitaxial Thin Films Deposited on (0001) Sapphire," Rigaku J., 13 [1] 3-7 (1996).
-
(1996)
Rigaku J.
, vol.13
, Issue.1
, pp. 3-7
-
-
Blanton, T.N.1
Hung, L.-S.2
-
48
-
-
0031130539
-
Orientation relationships in heteroepitaxial aluminum films on sapphire
-
D. L. Medlin, K. F. McCarty, R. Q. Hwang, S. E. Guthrie, and M. I. Baskes, "Orientation Relationships in Heteroepitaxial Aluminum Films on Sapphire," Thin Solid Films, 299, 110-4 (1997).
-
(1997)
Thin Solid Films
, vol.299
, pp. 110-114
-
-
Medlin, D.L.1
McCarty, K.F.2
Hwang, R.Q.3
Guthrie, S.E.4
Baskes, M.I.5
-
50
-
-
0035876350
-
Structural variants in heteroepitaxial growth
-
C. P. Flynn and J. A. Eades, "Structural Variants in Heteroepitaxial Growth," Thin Solid Films, 389 [1-2] 116-37 (2001).
-
(2001)
Thin Solid Films
, vol.389
, Issue.1-2
, pp. 116-137
-
-
Flynn, C.P.1
Eades, J.A.2
-
51
-
-
27644537403
-
Substrate surface step effects on microstructure of epitaxial films
-
J. Quo, H. L. M. Chang, and D. J. Lam, "Substrate Surface Step Effects on Microstructure of Epitaxial Films," Appl. Phys. Lett., 61 [26] 3116-7 (1992).
-
(1992)
Appl. Phys. Lett.
, vol.61
, Issue.26
, pp. 3116-3117
-
-
Quo, J.1
Chang, H.L.M.2
Lam, D.J.3
-
53
-
-
0017521861
-
An electron microscope study of perovskite-related oxides in Sr-Ti-O system
-
R. J. D. Tilley, "An Electron Microscope Study of Perovskite-Related Oxides in Sr-Ti-O System," J. Solid State Chem., 21 [4] 293-301 (1977).
-
(1977)
J. Solid State Chem.
, vol.21
, Issue.4
, pp. 293-301
-
-
Tilley, R.J.D.1
-
54
-
-
0034160990
-
Defect structure in homoepitaxial non-stoichiometric strontium titanate thin films
-
T. Suzuki, Y. Nishi, and M. Fujimoto, "Defect Structure in Homoepitaxial Non-Stoichiometric Strontium Titanate Thin Films," Philos. Mag. A, 80 [3] 621-37 (2000).
-
(2000)
Philos. Mag. A
, vol.80
, Issue.3
, pp. 621-637
-
-
Suzuki, T.1
Nishi, Y.2
Fujimoto, M.3
-
57
-
-
0032680399
-
3 dielectrics for future stacked-capacitor DRAM
-
3 Dielectrics for Future Stacked-Capacitor DRAM," IBM J. Res. Develop., 43 [3] 367-82 (1999).
-
(1999)
IBM J. Res. Develop.
, vol.43
, Issue.3
, pp. 367-382
-
-
Kotecki, D.E.1
Baniecki, J.D.2
Shen, H.3
Laibowitz, R.B.4
Saenger, K.L.5
Lian, J.J.6
Shaw, T.M.7
Athavale, S.D.8
Cabrai, C.9
Duncombe, P.R.10
Gutsche, M.11
Kunkel, G.12
Park, Y.J.13
Wang, Y.Y.14
Wise, R.15
-
58
-
-
0032362042
-
Dielectric properties and microstructure of thin BST films
-
S. M. Bilodeau, R. Carl, P. C. Van Buskirk, J. F. Roeder, C. Basceri, S. E. Lash, C. B. Parker, S. K. Streiffer, and A. I. Kingon, "Dielectric Properties and Microstructure of Thin BST Films," J. Korean Phys. Soc., 32, S1591-4 (1998).
-
(1998)
J. Korean Phys. Soc.
, vol.32
-
-
Bilodeau, S.M.1
Carl, R.2
Van Buskirk, P.C.3
Roeder, J.F.4
Basceri, C.5
Lash, S.E.6
Parker, C.B.7
Streiffer, S.K.8
Kingon, A.I.9
-
59
-
-
0000084660
-
Characterization of sputtered barium strontium titanate and strontium titanate thin films
-
B. A. Baumert, L. H. Chang, A. T. Matsuda, T. L. Tsai, C. J. Tracy, R. B. Gregory, P. L. Fejes, N. G. Cave, D. J. Taylor, T. Otsuki, E. Fujii, S. Hayashi, and K. Suu, "Characterization of Sputtered Barium Strontium Titanate and Strontium Titanate Thin Films," J. Appl. Phys., 82 [5] 2558-66 (1997).
-
(1997)
J. Appl. Phys.
, vol.82
, Issue.5
, pp. 2558-2566
-
-
Baumert, B.A.1
Chang, L.H.2
Matsuda, A.T.3
Tsai, T.L.4
Tracy, C.J.5
Gregory, R.B.6
Fejes, P.L.7
Cave, N.G.8
Taylor, D.J.9
Otsuki, T.10
Fujii, E.11
Hayashi, S.12
Suu, K.13
-
60
-
-
0031997519
-
Influence of the microstructure of Pt/Si substrates on textured growth of barium titanate thin films prepared by pulsed laser deposition
-
C. S. Hwang, M. D. Vaudin, and P. K. Schenck, "Influence of the Microstructure of Pt/Si Substrates on Textured Growth of Barium Titanate Thin Films Prepared by Pulsed Laser Deposition," J. Mater. Res., 13 [2] 368-75 (1998).
-
(1998)
J. Mater. Res.
, vol.13
, Issue.2
, pp. 368-375
-
-
Hwang, C.S.1
Vaudin, M.D.2
Schenck, P.K.3
-
62
-
-
0031146842
-
Microstructural changes of Pt/Ti bilayer during annealing in different atmospheres - An XRD study
-
A. Ehrlich, W. Weiss, W. Hoyer, and T. Gessner, "Microstructural Changes of Pt/Ti Bilayer During Annealing in Different Atmospheres - An XRD Study," Thin Solid Films, 300 [1-2] 122-30 (1997).
-
(1997)
Thin Solid Films
, vol.300
, Issue.1-2
, pp. 122-130
-
-
Ehrlich, A.1
Weiss, W.2
Hoyer, W.3
Gessner, T.4
-
63
-
-
0027875634
-
Preferred orientations for sol-gel derived PLZT thin layers
-
T. Tani, Z. Xu, and D. A. Payne, "Preferred Orientations for Sol-Gel Derived PLZT Thin Layers," Mater. Res. Soc. Symp. Proc., 310, 269-74 (1993).
-
(1993)
Mater. Res. Soc. Symp. Proc.
, vol.310
, pp. 269-274
-
-
Tani, T.1
Xu, Z.2
Payne, D.A.3
-
64
-
-
0001143028
-
2 seeding
-
2 Seeding," J. Appl. Phys., 83 [7] 3835-41 (1998).
-
(1998)
J. Appl. Phys.
, vol.83
, Issue.7
, pp. 3835-3841
-
-
Muralt, P.1
Maeder, T.2
Sagalowicz, L.3
Hiboux, S.4
Scalese, S.5
Naumovic, D.6
Agostino, R.G.7
Xanthopoulos, N.8
Mathieu, H.J.9
Patthey, L.10
Bullock, E.L.11
-
65
-
-
0035971675
-
3 thin films under direct-current bias
-
3 Thin Films Under Direct-Current Bias," Appl. Phys. Lett., 78 [18] 2754-6 (2001).
-
(2001)
Appl. Phys. Lett.
, vol.78
, Issue.18
, pp. 2754-2756
-
-
Ang, C.1
Cross, L.E.2
Yu, Z.3
Guo, R.4
Bhalla, A.S.5
Hao, J.H.6
-
68
-
-
0001126869
-
Microwave losses in strontium titanate above the phase transition
-
G. Rupprecht and R. O. Bell, "Microwave Losses in Strontium Titanate Above the Phase Transition," Phys. Rev., 125 [6] 1915-20 (1962).
-
(1962)
Phys. Rev.
, vol.125
, Issue.6
, pp. 1915-1920
-
-
Rupprecht, G.1
Bell, R.O.2
-
69
-
-
0036607423
-
Phase diagrams and dielectric response of epitaxial barium strontium titanate films: A theoretical analysis
-
Z. G. Ban and S. P. Alpay, "Phase Diagrams and Dielectric Response of Epitaxial Barium Strontium Titanate Films: A Theoretical Analysis," J. Appl. Phys., 91 [11] 9288-96 (2002).
-
(2002)
J. Appl. Phys.
, vol.91
, Issue.11
, pp. 9288-9296
-
-
Ban, Z.G.1
Alpay, S.P.2
-
70
-
-
0036149167
-
Strain-induced diffuse dielectric anomaly and critical point in perovskite ferroelectric thin films
-
art.-no. 012104
-
A. K. Tagantsev, N. A. Pertsev, P. Muralt, and N. Setter, "Strain-Induced Diffuse Dielectric Anomaly and Critical Point in Perovskite Ferroelectric Thin Films," Phys. Rev. B, 65 [1] (2002), art.-no. 012104.
-
(2002)
Phys. Rev. B
, vol.65
, Issue.1
-
-
Tagantsev, A.K.1
Pertsev, N.A.2
Muralt, P.3
Setter, N.4
-
71
-
-
34547607368
-
3
-
3," J. Appl. Phys., 62 [8] 3331-8 (1987).
-
(1987)
J. Appl. Phys.
, vol.62
, Issue.8
, pp. 3331-3338
-
-
Haun, M.J.1
Furman, E.2
Jang, S.J.3
McKinstry, H.A.4
Cross, L.E.5
-
73
-
-
0022182612
-
Thermal-expansion data. 8. Complex oxides, ABO, the perovskites
-
D. Taylor, "Thermal-Expansion Data. 8. Complex Oxides, ABO, the Perovskites," J. Br. Ceram. Soc., 84 [6] 181-8 (1985).
-
(1985)
J. Br. Ceram. Soc.
, vol.84
, Issue.6
, pp. 181-188
-
-
Taylor, D.1
-
75
-
-
0035606019
-
Prediction of a low-temperature ferroelectric instability in antiphase domain boundaries of strontium titanate
-
art-no. 224107
-
A. K. Tagantsev, E. Courtens, and L. Arzel, "Prediction of a Low-temperature Ferroelectric Instability in Antiphase Domain Boundaries of Strontium Titanate," Phys. Rev. B, 64 [22] (2001), art-no. 224107.
-
(2001)
Phys. Rev. B
, vol.64
, Issue.22
-
-
Tagantsev, A.K.1
Courtens, E.2
Arzel, L.3
-
76
-
-
27644536538
-
Dlelectric properties of insulators
-
Edited by G. L. Trigg and E. H. Immergut. VCH Publishers, New York
-
J. F. Scott, "Dlelectric Properties of Insulators;" pp. 25-45 in Encyclopedia of Applied Physics, Vol. 5, Edited by G. L. Trigg and E. H. Immergut. VCH Publishers, New York, 1992.
-
(1992)
Encyclopedia of Applied Physics
, vol.5
, pp. 25-45
-
-
Scott, J.F.1
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