Defect structure in homoepitaxial non-stoichiometric strontium titanate thin films

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 80, Issue 3, 2000, Pages 621-637

  Suzuki, Toshimasa ^a   Nishi, Yuji ^a   Fujimoto, Masayuki ^a  

^a TAIYO YUDEN CO LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSIVE STRESS; CRYSTAL MICROSTRUCTURE; DISLOCATIONS (CRYSTALS); EPITAXIAL GROWTH; LATTICE CONSTANTS; PULSED LASER DEPOSITION; SHEAR STRESS; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

LATTICE MISMATCH; STRONTIUM TITANATE;

STRONTIUM COMPOUNDS;

EID: 0034160990     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418610008212072     Document Type: Article

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