Dielectric properties and microstructure of thin BST films

Journal of the Korean Physical Society

Volumn 32, Issue 4 SUPPL., 1998, Pages

  Bilodeau, S M ^a   Carl, R ^a   Van Buskirk, P C ^a   Roeder, J F ^a   Basceri, Cem ^b   Lash, S E ^b   Parker, C B ^b   Streiffer, S K ^b   Kingon, A I ^b  

^a Advanced Technology Materials Inc   (United States)

^b North Carolina State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032362042     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)

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