Characterization of sputtered barium strontium titanate and strontium titanate-thin films

Journal of Applied Physics

Volumn 82, Issue 5, 1997, Pages 2558-2566

  Baumert, B A ^a   Chang, L H ^a   Matsuda, A T ^a   Tsai, T L ^a   Tracy, C J ^a   Gregory, R B ^a   Fejes, P L ^a   Cave, N G ^a   Chen, W ^a   Taylor, D J ^b   Otsuki, T ^c   Fujii, E ^c   Hayashi, S ^c   Suu, K ^d  

^a MOTOROLA INC   (United States)

^b Mat Res and Strategic Technologies   (United States)

^c PANASONIC CORPORATION   (Japan)

^d Chiba Institute for Super Materials   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000084660     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366066     Document Type: Article

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