Models of electrode-dielectric interfaces in ferroelectric thin-film devices

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 41, Issue 11 B, 2002, Pages 6848-6851

  Dawber, Matthew ^a   Scott, James F ^a  

^a Symetrix Centre for Ferroics   (United Kingdom)

Author keywords

Ferroelectric; Interfacial capacitance; Screening; Space charge

Indexed keywords

DIELECTRIC PROPERTIES; ELECTRIC SPACE CHARGE; ELECTRODES; FERROELECTRIC DEVICES;

ELECTRODE-DIELECTRIC INTERFACES; FERROELECTRIC; INTERFACIAL CAPACITANCE;

THIN FILMS;

EID: 0038410971     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.41.6848     Document Type: Article

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