Intrinsic dead layer effect and the performance of ferroelectric thin film capacitors

Journal of Applied Physics

Volumn 82, Issue 6, 1997, Pages 3081-3088

  Zhou, C ^a   Newns, D M ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001264799     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366147     Document Type: Article

References (14)

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