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Volumn 475, Issue 1-2 SPEC. ISS., 2005, Pages 91-96

Spatially resolved optical emission spectroscopy of pulse magnetron sputtering discharge

Author keywords

Pulsed plasma; Reactive magnetron sputtering; Spatially resolved OES

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAMERAS; CHARGE COUPLED DEVICES; ELECTRIC DISCHARGES; ELECTRIC POTENTIAL; ELECTROSTATICS; EMISSION SPECTROSCOPY; SILICON WAFERS; TITANIUM NITRIDE;

EID: 13444267781     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.07.020     Document Type: Conference Paper
Times cited : (13)

References (27)
  • 2
    • 0003666038 scopus 로고
    • S.M. Rossnagel J.J. Cuomo W.D. Westwood Noyes Publications Park Ridge, NJ, USA
    • S.M. Rossnagel S.M. Rossnagel J.J. Cuomo W.D. Westwood Handbook of Plasma Processing Technology 1990 Noyes Publications Park Ridge, NJ, USA 160
    • (1990) Handbook of Plasma Processing Technology , pp. 160
    • Rossnagel, S.M.1
  • 23
    • 0003746634 scopus 로고
    • J.J. Cuomo M.R. Rossnagel H.R. Kaufman Noyes Publications Park Ridge, NJ, USA
    • K.-H. Muller J.J. Cuomo M.R. Rossnagel H.R. Kaufman Handbook of Ion Beam Processing Technology 1989 Noyes Publications Park Ridge, NJ, USA 262
    • (1989) Handbook of Ion Beam Processing Technology , pp. 262
    • Muller, K.-H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.