An improved de-embedding technique for on-wafer high-frequency characterization

Proceedings of the 1991 Bipolar Circuits and Technology Meeting

Volumn , Issue , 1992, Pages 188-191

  Koolen, M C A M ^a   Geelen, J A M ^a   Versleijen, M P J G ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVE MEASUREMENTS; TRANSISTORS, BIPOLAR--TESTING;

HF CHARACTERIZATION; ON-WAFER CHARACTERIZATION; S-PARAMETER MEASUREMENTS; Y-PARAMETERS;

SEMICONDUCTOR DEVICE TESTING;

EID: 0026679924     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)