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Volumn , Issue , 1997, Pages 73-76
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Ultra-thin gate dielectrics: They break down, but do they fail?
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Author keywords
[No Author keywords available]
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Indexed keywords
ULTRATHIN GATE DIELECTRICS;
ELECTRIC BREAKDOWN OF SOLIDS;
GATES (TRANSISTOR);
SPURIOUS SIGNAL NOISE;
ULTRATHIN FILMS;
DIELECTRIC DEVICES;
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EID: 84886448127
PISSN: 01631918
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (216)
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References (8)
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