Raman investigations of disorder in InN thin films grown by reactive sputtering on GaAs

Journal of Applied Physics

Volumn 93, Issue 5, 2003, Pages 2643-2647

  Qian, Z G ^a   Shen, W Z ^a   Ogawa, H ^b   Guo, Q X ^b  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

^b SAGA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; GALLIUM COMPOUNDS; RAMAN SCATTERING; SPUTTERING; THIN FILMS; X RAY DIFFRACTION;

REACTIVE SPUTTERING;

INDIUM COMPOUNDS;

EID: 0037349763     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1542671     Document Type: Article

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