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Volumn 114, Issue 7, 2000, Pages 355-360

Identification of Raman-active phonon modes in oriented platelets of InN and polycrystalline InN

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; PHONONS; POLYCRYSTALLINE MATERIALS; PRESSURE EFFECTS; RAMAN SCATTERING; SEMICONDUCTOR GROWTH;

EID: 0033878436     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(00)00078-8     Document Type: Article
Times cited : (31)

References (33)
  • 1
    • 0009379863 scopus 로고
    • Silicon Carbide and Related Materials
    • S. Nakashima, H. Matsunami, S. Yoshida, & H. Harima. Bristol/Philadelphia: Institute of Physics
    • Inushima T., Yaguchi T., Nagase A, Iso A., Shiraishi T. Nakashima S., Matsunami H., Yoshida S., Harima H. Silicon Carbide and Related Materials. Institute of Physics Conference Series. Vol. 142:1995;971 Institute of Physics, Bristol/Philadelphia.
    • (1995) Institute of Physics Conference Series , vol.142 , pp. 971
    • Inushima, T.1    Yaguchi, T.2    Nagase, A.3    Iso, A.4    Shiraishi, T.5
  • 7
  • 22
    • 0003685207 scopus 로고
    • Properties of Group III Nitrides
    • J.H. Edgar. London: INSPEC (The Institution of Electrical Engineers)
    • McNeil L.E. Edgar J.H. Properties of Group III Nitrides. EMIS Datareviews Series. Vol. 11:1994;254 INSPEC (The Institution of Electrical Engineers), London.
    • (1994) EMIS Datareviews Series , vol.11 , pp. 254
    • McNeil, L.E.1
  • 27
    • 0003372760 scopus 로고
    • Properties of Group III Nitrides
    • J.H. Edgar. London: INSPEC (The Institution of Electrical Engineers)
    • Tansley T.L. Edgar J.H. Properties of Group III Nitrides. EMIS Datareviews Series. Vol. 11:1994;35 INSPEC (The Institution of Electrical Engineers), London.
    • (1994) EMIS Datareviews Series , vol.11 , pp. 35
    • Tansley, T.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.