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Volumn 174, Issue 1-4, 1997, Pages 641-646

A comparative study of OMVPE-grown InN heteroepitaxial layers on GaAs(1 1 1)B and α-Al2O3(0 0 0 1) substrates

Author keywords

GaAs(1 1 1)B; Heteroepitaxy; ; InN; Nitridation; OMVPE; Al2O3(0 0 0 1)

Indexed keywords

ALUMINA; CRYSTAL STRUCTURE; HIGH TEMPERATURE EFFECTS; METALLORGANIC VAPOR PHASE EPITAXY; MORPHOLOGY; NUCLEATION; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR GROWTH; SUBSTRATES; SURFACE ROUGHNESS;

EID: 0031547230     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(97)00057-2     Document Type: Article
Times cited : (29)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.