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Volumn 174, Issue 1-4, 1997, Pages 641-646
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A comparative study of OMVPE-grown InN heteroepitaxial layers on GaAs(1 1 1)B and α-Al2O3(0 0 0 1) substrates
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Author keywords
GaAs(1 1 1)B; Heteroepitaxy; ; InN; Nitridation; OMVPE; Al2O3(0 0 0 1)
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Indexed keywords
ALUMINA;
CRYSTAL STRUCTURE;
HIGH TEMPERATURE EFFECTS;
METALLORGANIC VAPOR PHASE EPITAXY;
MORPHOLOGY;
NUCLEATION;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTOR GROWTH;
SUBSTRATES;
SURFACE ROUGHNESS;
HETEROEPITAXY;
NITRIDATION;
SEMICONDUCTING INDIUM COMPOUNDS;
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EID: 0031547230
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(97)00057-2 Document Type: Article |
Times cited : (29)
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References (8)
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