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Volumn 62, Issue 20, 2000, Pages 13617-13622
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Detection of doping atom distributions and individual dopants in InAs(110) by dynamic-mode scanning force microscopy in ultrahigh vacuum
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Author keywords
[No Author keywords available]
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Indexed keywords
ALLOY;
ARTICLE;
ATOMIC PARTICLE;
DENSITY;
ELECTRIC POTENTIAL;
IONIZATION;
SCANNING FORCE MICROSCOPY;
SEMICONDUCTOR;
THICKNESS;
VACUUM;
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EID: 0034668501
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevB.62.13617 Document Type: Article |
Times cited : (28)
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References (29)
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