Atomic structure at the Si(001)-SiO2 interface: From the interpretation of Si 2p core-level shifts to a model structure

Materials Science and Engineering: B

Volumn 96, Issue 2, 2002, Pages 102-106

  Bongiorno, Angelo ^a   Pasquarello, Alfredo ^a  

^a INSTITUT ROMAND DE RECHERCHE NUMÉRIQUE EN PHYSIQUE DES MATÉRIAUX IRRMA   (Switzerland)

Author keywords

Photoemission modeling; Si SiO2 interface

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; OXIDATION; PHOTOEMISSION; REFLECTION; SILICA; SYNCHROTRON RADIATION; X RAYS;

X-RAY REFLECTIVITY;

INTERFACES (MATERIALS);

EID: 0036841927     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(02)00299-4     Document Type: Conference Paper

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