Nitrogen incorporation at Si(001)- SiO2interfaces: Relation between N 1s core-level shifts and microscopic structure

Physical Review Letters

Volumn 79, Issue 25, 1997, Pages 5174-5177

  Rignanese, G M ^a,b   Pasquarello, Alfredo ^a,c,d   Charlier, J C ^a   Gonze, X ^b   Car, Roberto ^a,c  

^a INSTITUT ROMAND DE RECHERCHE NUMÉRIQUE EN PHYSIQUE DES MATÉRIAUX IRRMA   (Switzerland)

^b UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^c UNIVERSITY OF GENEVA   (Switzerland)

^d LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 6144251230     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.79.5174     Document Type: Article

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