An inquiry concerning the principles of Si 2p core-level photoemission shift assignments at the Si/SiO2 interface

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 4, 1996, Pages 2824-2831

  McFeely, F R ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011135147     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588840     Document Type: Article

References (28)

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