Nitrogen bonding configurations at nitrided Si(001) surfaces and Si(001)-SiO2interfaces: A first-principles study of core-level shifts

Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 7, 2001, Pages

  Rignanese, G M ^a   Pasquarello, Alfredo ^b  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^b INSTITUT ROMAND DE RECHERCHE NUMÉRIQUE EN PHYSIQUE DES MATÉRIAUX IRRMA   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

NITRITE; NITROGEN; SILICON DERIVATIVE;

ARTICLE; CALCULATION; CHEMICAL BOND; MATHEMATICAL MODEL; MEASUREMENT; SPECTROSCOPY; STRUCTURE ANALYSIS; SURFACE PROPERTY;

EID: 0035108607     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.63.075307     Document Type: Article

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