New technique for fast characterization of SILC distribution in flash arrays

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2001, Pages 73-80

  Ielmini, D ^a   Spinelli, A S ^b   Lacaita, A L ^a   Confalonieri, L ^c   Visconti, A ^c  

^a POLITECNICO DI MILANO   (Italy)

^b INFM   (Italy)

^c STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ARRAYS; BUILT-IN SELF TEST; ELECTRIC CURRENT DISTRIBUTION; FLASH MEMORY; LEAKAGE CURRENTS; MICROPROCESSOR CHIPS;

BIMODAL DISTRIBUTION; FLASH ARRAYS; MEMORY ARRAY UNDER TEST; STRESS INDUCED LEAKAGE CURRENT;

RELIABILITY;

EID: 0034995124     PISSN: 00999512     EISSN: None     Source Type: Journal    
DOI: 10.1109/RELPHY.2001.922885     Document Type: Article

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