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Volumn , Issue , 2001, Pages 73-80
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New technique for fast characterization of SILC distribution in flash arrays
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Author keywords
[No Author keywords available]
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Indexed keywords
ARRAYS;
BUILT-IN SELF TEST;
ELECTRIC CURRENT DISTRIBUTION;
FLASH MEMORY;
LEAKAGE CURRENTS;
MICROPROCESSOR CHIPS;
BIMODAL DISTRIBUTION;
FLASH ARRAYS;
MEMORY ARRAY UNDER TEST;
STRESS INDUCED LEAKAGE CURRENT;
RELIABILITY;
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EID: 0034995124
PISSN: 00999512
EISSN: None
Source Type: Journal
DOI: 10.1109/RELPHY.2001.922885 Document Type: Article |
Times cited : (20)
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References (33)
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