FET noise-parameter determination using a novel technique based on 50-f2 noise-figure measurements

IEEE Transactions on Microwave Theory and Techniques

Volumn 47, Issue 3, 1999, Pages 315-324

  Lâzaro, Antonio ^a,b   Pradell, Lluis ^a   O'Callaghan, Juan M ^a  

^a IEEE   (Spain)

^b UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

Author keywords

Noise measurements; Noise modeling; Noise parameters

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; MATHEMATICAL MODELS; MATRIX ALGEBRA; SIGNAL NOISE MEASUREMENT; SPURIOUS SIGNAL NOISE;

INTRINSIC NOISE MATRIX PARAMETERS; MATCHED SOURCE REFLECTION COEFFICIENTS;

FIELD EFFECT TRANSISTORS;

EID: 0033100125     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.750233     Document Type: Article

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