Computer-Aided Determination of Microwave Two-Port Noise Parameters

IEEE Transactions on Microwave Theory and Techniques

Volumn 26, Issue 9, 1978, Pages 639-642

  Caruso, Giuseppe ^a   Sannino, Mario ^a  

^a UNIVERSITY OF PALERMO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTERS - APPLICATIONS; MATHEMATICAL MODELS; MATHEMATICAL TECHNIQUES - LEAST SQUARES APPROXIMATIONS; TRANSISTORS - MICROWAVES;

NOISE PARAMETERS; SOURCE ADMITTANCE;

ELECTRIC NETWORKS;

EID: 0018018880     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/TMTT.1978.1129454     Document Type: Article

References (5)

1. “IRE Standards on methods of measuring noise in linear two-port, 1959,” Proc. IRE, vol. 48, pp. 60–68, Jan. 1960.
2. W. Kokyczka, A. Leupp, and M. J. O. Strutt “Computer-aided determination of two-port noise parameters (CADON),” Proc. IEEE, vol. 58, pp. 1850–1851, Nov. 1970.
3. R. Q. Lane “The determination of device noise parameters,” Proc. IEEE, vol. 57, pp. 1461–1462, Aug. 1969.
4. J. Lange “Noise characterization of linear two-ports in terms of invariant parameters,” IEEE J. Solid-State Circuits, vol. SC-2, pp. 37–40, June 1967.
5. H. Fukui “The noise performance of microwave transistor,” IEEE Trans. Electron Devices, vol. ED-13, pp. 329–341, Mar. 1966.