A new extraction method for noise sources and correlation coefficient in MESFET

IEEE Transactions on Microwave Theory and Techniques

Volumn 44, Issue 3, 1996, Pages 487-490

  Han, Jong Hee ^a   Lee, Kwyro ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CORRELATION METHODS; ELECTROMAGNETIC WAVE SCATTERING; EQUIVALENT CIRCUITS; NUMERICAL METHODS; REGRESSION ANALYSIS; SEMICONDUCTING GALLIUM ARSENIDE; SPURIOUS SIGNAL NOISE; TRANSCONDUCTANCE;

CORRELATION COEFFICIENT; EXTRACTION METHOD; LINEAR REGRESSION; NOISE EQUIVALENT CIRCUIT; NOISE SOURCES;

MESFET DEVICES;

EID: 0030104153     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.486166     Document Type: Article

References (8)

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8. M. Berroth and R. Bosch, "High-frequency equivalent circuit of GaAs FET's for large-signal applications," IEEE Trans. Microwave Theory Tech., vol. 39, no. 2, pp. 224-229, Feb. 1991.