Accuracy Improvements In Microwave Noise Parameter Measurements

IEEE Transactions on Microwave Theory and Techniques

Volumn 37, Issue 12, 1989, Pages 1973-1978

  Davidson, Andrew C ^a   Leake, Bernard W ^a   Strid, Eric ^a  

^a Cascade Microtech Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYZERS; MEASUREMENT ERRORS; MICROWAVE DEVICES--NOISE, SPURIOUS SIGNAL; NOISE, SPURIOUS SIGNAL--MEASUREMENTS;

HEMT NOISE MEASUREMENT; MICROWAVE NOISE MEASUREMENT; SCATTERING PARAMETERS MEASUREMENT; VECTOR NETWORK ANALYZER;

MICROWAVE MEASUREMENTS;

EID: 0024888749     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.44110     Document Type: Article

References (11)

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3. E. Strid, “Measurement of losses in noise-matching networks,” IEEE Trans. Microwave Theory and Tech., vol. MTT-29, pp. 247–252, Mar. 1981.
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6. M. Mitama and H. Katoh, “An improved computational method for noise parameter measurement,” IEEE Trans. Microwave Theory Tech., vol. MTT-27, pp. 612–615, June 1979.
7. Cascade Microtech Model 42 Operation Manual, ch. 4. Cascade Microtech, Beaverton, OR.
8. K. Jones and E. Strid, “Where are my on-wafer reference planes?” in IEEE ARFTG Dig., pp. 27–40, Dec. 1987.
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10. N. J. Kuhn, “Curing a subtle but significant cause of noise figure error,” Microwave J., vol. 27, pp. 85–98, June 1984.
11. A. Adamian and A. Uhlir, “A novel procedure for receiver noise characterization,” IEEE Trans. Instrum. Meas., vol. IM-22 pp. 181–182, June 1973.