LRM and LRRM calibrations with automatic determination of load inductance

36th ARFTG Conference Digest - Fall 1990

Volumn , Issue , 1990, Pages 57-63

  Davidson, Andrew ^a   Jones, Keith ^a   Strid, Eric ^a  

^a Cascade Microtech Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; ELECTRIC NETWORK ANALYZERS; ELECTRIC RESISTANCE;

AUTOMATIC DETERMINATION; CALIBRATION PROCESS; INDUCTANCE MODELS; INDUCTANCE VALUES; LOAD INDUCTANCE; ON-WAFER CALIBRATION; SERIES RESISTANCES; VECTOR NETWORK ANALYZERS;

INDUCTANCE;

EID: 85057204899     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1990.323996     Document Type: Conference Paper

References (6)

1. A. Davidson, E. Strid, and K. Jones. "Achieving greater on-wafer S-parameter accuracy with the LRM calibration technique. " IEEE ARFTG Digest Dec. 1989. '
2. J. Barr and M. Pervere. "A generalized vector network analyzer calibration technique. " IEEE ARFTG Digest. Dec. 1989.
3. H. J. Eul and B. Schiek. "Thru-match-reflect: One result of a rigorous theory for de-embedding and network analyzer calibration. " Proceedings of the 1988 European Microwave Conference. September, 1988.
4. K. Jones and E. Strid. "Where are my on-wafer reference planes" IEEE ARFTG Digest Dec. 1987.
5. U. S. patent 4, 858, 160.
6. John T. Barr, Terry Burcham, Andrew C. Davidson, and Eric W. Strid. "Advancements in on-wafer probing calibration techniques. " Hewlett-Packard RF & Microwave Symposium and Exhibition April 1990. 1.