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Volumn 34, Issue 3, 1998, Pages 289-291

Direct extraction of all four transistor noise parameters from 50Ω noise figure measurements

Author keywords

[No Author keywords available]

Indexed keywords

EQUIVALENT CIRCUITS; MATRIX ALGEBRA; TRANSISTORS;

EID: 0032484871     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19980192     Document Type: Article
Times cited : (11)

References (13)
  • 1
    • 0014638211 scopus 로고
    • The determination of device noise parameters
    • LANE, R.Q.: 'The determination of device noise parameters', Proc. IEEE, 1969, 57, pp. 1461-1462
    • (1969) Proc. IEEE , vol.57 , pp. 1461-1462
    • Lane, R.Q.1
  • 2
    • 0018518499 scopus 로고
    • On the determination of device noise and gain parameters (of linear two-ports)
    • SANNINO, M.: 'On the determination of device noise and gain parameters (of linear two-ports)', Proc. IEEE, 1979, 67, (9), pp. 1364-1366
    • (1979) Proc. IEEE , vol.67 , Issue.9 , pp. 1364-1366
    • Sannino, M.1
  • 3
    • 0024888749 scopus 로고
    • Accuracy improvements in microwave noise parameter measurements
    • DAVIDSON, A.C., LEAKE, B.W., and STRID, E.: 'Accuracy improvements in microwave noise parameter measurements', IEEE Trans. Microwave Theory Tech., 1989, 37, (12), pp. 1973-1978
    • (1989) IEEE Trans. Microwave Theory Tech. , vol.37 , Issue.12 , pp. 1973-1978
    • Davidson, A.C.1    Leake, B.W.2    Strid, E.3
  • 4
    • 11544261814 scopus 로고    scopus 로고
    • Cascade-Microtech, Inc., 14255 SW Brigadoon, Beaverton, OR 97005
    • NPTS-26 System, Cascade-Microtech, Inc., 14255 SW Brigadoon, Beaverton, OR 97005
    • NPTS-26 System
  • 5
    • 0030217383 scopus 로고    scopus 로고
    • Ill conditioning loci in noise parameter determination
    • O'CALLAGHAN, J.M., ALEGRET, A., PRADELL, L., and CORBELLA, I.: 'Ill conditioning loci in noise parameter determination', Electron. Lett., 1996, 32, (18), pp. 1680-1681
    • (1996) Electron. Lett. , vol.32 , Issue.18 , pp. 1680-1681
    • O'Callaghan, J.M.1    Alegret, A.2    Pradell, L.3    Corbella, I.4
  • 6
    • 0016947365 scopus 로고
    • An efficient method for computer aided noise analysis of linear amplifier networks
    • HILLBRAND, H., and RUSSER, P.R.: 'An efficient method for computer aided noise analysis of linear amplifier networks', IEEE Trans. Circuits Syst., 1976, 23, (4), pp. 235-238
    • (1976) IEEE Trans. Circuits Syst. , vol.23 , Issue.4 , pp. 235-238
    • Hillbrand, H.1    Russer, P.R.2
  • 7
    • 0024738288 scopus 로고
    • Modeling of noise parameters of MESFET's and MODFET's and their frecuency and temperature dependence
    • POSPIESZALSKI, M.: 'Modeling of noise parameters of MESFET's and MODFET's and their frecuency and temperature dependence', IEEE Trans. Microwave Theory Tech., 1989, 37, (9), pp. 1340-1350
    • (1989) IEEE Trans. Microwave Theory Tech. , vol.37 , Issue.9 , pp. 1340-1350
    • Pospieszalski, M.1
  • 9
    • 0028427016 scopus 로고
    • Microscopic noise modeling and macroscopic noise models: How good a connection?
    • DANNEVILLE, F., HAPPY, H., DAMBRINE, G., BELQUIN, J., and CAPPY, A.: 'Microscopic noise modeling and macroscopic noise models: How good a connection?', IEEE Trans. Electron Devices, 1994, 41, (5), pp. 779-785
    • (1994) IEEE Trans. Electron Devices , vol.41 , Issue.5 , pp. 779-785
    • Danneville, F.1    Happy, H.2    Dambrine, G.3    Belquin, J.4    Cappy, A.5
  • 10
    • 0026943511 scopus 로고
    • A general noise de-embedding procedure for packaged two-port linear active devices
    • PUCEL. R.A.: 'A general noise de-embedding procedure for packaged two-port linear active devices', IEEE Trans. Microwave Theory Tech., 1992, 40, (11), pp. 2013-2020
    • (1992) IEEE Trans. Microwave Theory Tech. , vol.40 , Issue.11 , pp. 2013-2020
    • Pucel, R.A.1
  • 11
    • 0023999375 scopus 로고
    • Microwave noise characterization of GaAs MESFET's, determination of extrinsic noise parameters
    • GUPTA, M.S., and GREILING, P.T.: 'Microwave noise characterization of GaAs MESFET's, determination of extrinsic noise parameters', IEEE Trans. Microwave Theory Tech., 1988, 36, (4), pp. 745-751
    • (1988) IEEE Trans. Microwave Theory Tech. , vol.36 , Issue.4 , pp. 745-751
    • Gupta, M.S.1    Greiling, P.T.2
  • 12
    • 0031095403 scopus 로고    scopus 로고
    • A new calculation approach of transistor noise parameters as a function of gatewidth and bias current
    • GASMI, A., RUYART, B., BERGEAULT, E., and JALLET, L.P.: 'A new calculation approach of transistor noise parameters as a function of gatewidth and bias current', IEEE Trans. Microwave Theory Tech., 1997, 45, (3), pp. 338-344
    • (1997) IEEE Trans. Microwave Theory Tech. , vol.45 , Issue.3 , pp. 338-344
    • Gasmi, A.1    Ruyart, B.2    Bergeault, E.3    Jallet, L.P.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.