메뉴 건너뛰기




Volumn 37, Issue 9, 1989, Pages 1340-1350

Modeling of Noise Parameters of MESFET's and MODFET's and Their Frequency and Temperature Dependence

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORKS--EQUIVALENT CIRCUITS; MICROWAVES; NOISE, SPURIOUS SIGNAL--MATHEMATICAL MODELS; TRANSISTORS, FIELD EFFECT;

EID: 0024738288     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.32217     Document Type: Article
Times cited : (594)

References (47)
  • 1
    • 84937350176 scopus 로고
    • Thermal noise in field-effect transistor
    • A. van der Ziel, “Thermal noise in field-effect transistor.” Proc. IRE, vol. 50, pp. 1808–1812, 1962.
    • (1962) Proc. IRE , vol.50 , pp. 1808-1812
    • van der Ziel, A.1
  • 2
    • 84938443557 scopus 로고
    • Gate noise in field-effect transistors at moderately high frequencies
    • A. van der Ziel, “Gate noise in field-effect transistors at moderately high frequencies,” Proc. IRE, vol. 51, pp. 461–467, 1963.
    • (1963) Proc. IRE , vol.51 , pp. 461-467
    • van der Ziel, A.1
  • 3
    • 0012074622 scopus 로고
    • Thermal noise injunction gate field-effect transistors
    • Mar.
    • W.C. Bruncke and Z. van der Ziel, “Thermal noise injunction gate field-effect transistors,” IEEE Trans. Electron Devices, vol. ED-13. pp. 323–329, Mar. 1966.
    • (1966) IEEE Trans. Electron Devices , vol.13 ED , pp. 323-329
    • Bruncke, W.C.1    van der Ziel, Z.2
  • 4
    • 0015346425 scopus 로고
    • Noise behavior of GaAs field-effect transistor with short gate length
    • W. Baechtold, “Noise behavior of GaAs field-effect transistor with short gate length,” IEEE Trans. Electron Devices, vol. ED-19, pp. 674–680, 1972.
    • (1972) IEEE Trans. Electron Devices , vol.19 ED , pp. 674-680
    • Baechtold, W.1
  • 5
    • 0005898144 scopus 로고
    • Signal and noise properties of GaAs microwave FET
    • L. Morton, Ed. New York: Academic Press
    • R.A. Pucel, H.A. Haus, and H. Statz, “Signal and noise properties of GaAs microwave FET.” in Advances in Electronics and Electron Physics, vol. 38, L. Morton, Ed. New York: Academic Press, 1975.
    • (1975) Advances in Electronics and Electron Physics , vol.38
    • Pucel, R.A.1    Haus, H.A.2    Statz, H.3
  • 6
    • 0016963551 scopus 로고
    • Microwave field-effect transistors
    • June
    • C.H. Liechti, “Microwave field-effect transistors,” IEEE Trans. Microwave Theory Tech., vol. MTT-24, pp. 279–300, June 1976.
    • (1976) IEEE Trans. Microwave Theory Tech. , vol.24 MTT , pp. 279-300
    • Liechti, C.H.1
  • 7
    • 0020192473 scopus 로고
    • Noise in GaAs FET's with a non-uniform channel thickness
    • Oct.
    • T.M. Brookes, “Noise in GaAs FET's with a non-uniform channel thickness,” IEEE Trans. Electron Devices, vol. ED-29, pp. 1632–1634, Oct. 1982.
    • (1982) IEEE Trans. Electron Devices , vol.29 ED , pp. 1632-1634
    • Brookes, T.M.1
  • 8
    • 0022511516 scopus 로고
    • The noise properties of high-electron-mobility transistors
    • Jan.
    • T.M. Brookes, “The noise properties of high-electron-mobility transistors,” IEEE Trans. Electron Devices, vol. ED-33, pp. 52–57, Jan. 1986.
    • (1986) IEEE Trans. Electron Devices , vol.33 ED , pp. 52-57
    • Brookes, T.M.1
  • 10
    • 0022229523 scopus 로고
    • Noise modeling in submicrometer-gate, two-dimensional, electron-gas, field-effect transistors
    • Dec.
    • A. Cappy, A. Vanoverschelde, M. Schortgen, C. Versnaeyen, and G. Salmer, “Noise modeling in submicrometer-gate, two-dimensional, electron-gas, field-effect transistors,” IEEE Trans. Electron Devices, vol. ED-32, pp. 2787–2795, Dec. 1985.
    • (1985) IEEE Trans. Electron Devices , vol.32 ED , pp. 2787-2795
    • Cappy, A.1    Vanoverschelde, A.2    Schortgen, M.3    Versnaeyen, C.4    Salmer, G.5
  • 11
    • 0000907948 scopus 로고
    • A Monte Carlo particle study of the intrinsic noise figure in GaAs MESFET
    • Oct.
    • C. Moglestue, “A Monte Carlo particle study of the intrinsic noise figure in GaAs MESFET,” IEEE Trans. Electron Devices, vol. ED-32, pp. 2092–2096, Oct. 1985.
    • (1985) IEEE Trans. Electron Devices , vol.32 ED , pp. 2092-2096
    • Moglestue, C.1
  • 12
    • 0018491891 scopus 로고
    • Design of microwave GaAs MESFET's for broadband. low-noise amplifiers
    • July
    • H. Fukui, “Design of microwave GaAs MESFET's for broadband. low-noise amplifiers,” IEEE Trans. Microwave Theory Tech., vol. MTT-27, pp. 643–650, July 1979.
    • (1979) IEEE Trans. Microwave Theory Tech. , vol.27 MTT , pp. 643-650
    • Fukui, H.1
  • 13
    • 0018490967 scopus 로고
    • Optimal noise figure of microwave GaAs MESFET's
    • July
    • H. Fukui, “Optimal noise figure of microwave GaAs MESFET's,” IEEE Trans. Electron Devices, vol. ED-26, pp. 1032–1037, July 1979.
    • (1979) IEEE Trans. Electron Devices , vol.26 ED , pp. 1032-1037
    • Fukui, H.1
  • 14
    • 0022582648 scopus 로고
    • Comment on ‘Design of microwave GaAs MESFET's for broadband, low-noise amplifiers’
    • Jan.
    • M.W. Pospieszalski and W. Wiatr, “Comment on ‘Design of microwave GaAs MESFET's for broadband, low-noise amplifiers’,” IEEE Trans. Microwave Theory Tech., vol. MTT-34, p. 194, Jan. 1986.
    • (1986) IEEE Trans. Microwave Theory Tech. , vol.34 MTT , pp. 194
    • Pospieszalski, M.W.1    Wiatr, W.2
  • 15
    • 0022118752 scopus 로고
    • A new relationship between the Fukui coefficient and optimal current value for low-noise operation of field-effect transistors
    • Sept.
    • D. Delagebeaudeuf, I. Chevrier, M. Laviron, and P. Delescluse, “A new relationship between the Fukui coefficient and optimal current value for low-noise operation of field-effect transistors,” IEEE Electron Device Lett., vol. EDL-6, pp. 444–445, Sept. 1985.
    • (1985) IEEE Electron Device Lett. , vol.6 EDL , pp. 444-445
    • Delagebeaudeuf, D.1    Chevrier, I.2    Laviron, M.3    Delescluse, P.4
  • 16
    • 0022792365 scopus 로고
    • Simple models for high frequency MESFET's and comparison with experimental results
    • Oct.
    • C.H. Oxley and A.J. Holden, “Simple models for high frequency MESFET's and comparison with experimental results,” Proc. Inst. Elec. Eng., vol. 133, pt. H, pp. 335–340, Oct. 1986.
    • (1986) Proc. Inst. Elec. Eng. , vol.133 , pp. 335-340
    • Oxley, C.H.1    Holden, A.J.2
  • 17
    • 0019569028 scopus 로고
    • A functional GaAs FET noise model
    • May
    • A.F. Podell, “A functional GaAs FET noise model,” IEEE Trans. Electron Devices, vol. ED-28, pp. 511–517, May 1981.
    • (1981) IEEE Trans. Electron Devices , vol.28 ED , pp. 511-517
    • Podell, A.F.1
  • 18
    • 0023578788 scopus 로고
    • Microwave noise characterization of GaAs MESFET's: Evaluation by on-wafer, low frequency output noise current measurement
    • Dec.
    • M.S. Gupta, O. Pitzalis, S.E. Rosenbaum, and P.T. Greiling, “Microwave noise characterization of GaAs MESFET's: Evaluation by on-wafer, low frequency output noise current measurement,” IEEE Trans. Microwave Theory Tech., vol. MTT-35. pp. 1208–1217, Dec. 1987.
    • (1987) IEEE Trans. Microwave Theory Tech. , vol.35 MTT , pp. 1208-1217
    • Gupta, M.S.1    Pitzalis, O.2    Rosenbaum, S.E.3    Greiling, P.T.4
  • 19
    • 0023999375 scopus 로고
    • Microwave noise characterization of GaAs MESFET's: Determination of extrinsic noise parameters
    • Apr.
    • M.S. Gupta and P.T. Greiling, “Microwave noise characterization of GaAs MESFET's: Determination of extrinsic noise parameters,” IEEE Trans. Microwave Theory Tech., vol. 36, pp. 745–751, Apr. 1988.
    • (1988) IEEE Trans. Microwave Theory Tech. , vol.36 , pp. 745-751
    • Gupta, M.S.1    Greiling, P.T.2
  • 20
    • 0023844609 scopus 로고
    • Noise modeling and measurement technique
    • Jan.
    • A. Cappy, “Noise modeling and measurement technique,” IEEE Trans. Microwave Theory Tech., vol. 36, pp. 1–10, Jan. 1988.
    • (1988) IEEE Trans. Microwave Theory Tech. , vol.36 , pp. 1-10
    • Cappy, A.1
  • 21
    • 0019073445 scopus 로고
    • Low-noise, cooled GASFET amplifiers
    • Oct.
    • S. Weinreb, “Low-noise, cooled GASFET amplifiers,” IEEE Trans. Microwave Theory Tech., vol. MTT-28, pp. 1041–1054, Oct. 1980.
    • (1980) IEEE Trans. Microwave Theory Tech. , vol.28 MTT , pp. 1041-1054
    • Weinreb, S.1
  • 22
    • 0022665554 scopus 로고
    • Noise parameters and light sensitivity of low-noise, high-electron-mobility transistors at 300 K and 12.5 K
    • Feb.
    • M.W. Pospieszalski et al., “Noise parameters and light sensitivity of low-noise, high-electron-mobility transistors at 300 K and 12.5 K.” IEEE Trans. Electron Devices, vol. ED-33, pp. 218–223, Feb. 1986.
    • (1986) IEEE Trans. Electron Devices , vol.33 ED , pp. 218-223
    • Pospieszalski, M.W.1
  • 23
    • 0023983509 scopus 로고
    • FET's and HEMT's at cryogenic temperatures—Their properties and use in low-noise amplifiers
    • Mar.
    • M.W. Pospieszalski, S. Weinreb. R.D. Norrod, and R. Harris, “FET's and HEMT's at cryogenic temperatures—Their properties and use in low-noise amplifiers.” IEEE Trans. Microwave Theory Tech., vol. 36, pp. 552–559, Mar. 1988.
    • (1988) IEEE Trans. Microwave Theory Tech. , vol.36 , pp. 552-559
    • Pospieszalski, M.W.1    Weinreb, S.2    Norrod, R.D.3    Harris, R.4
  • 24
    • 0023980634 scopus 로고
    • UltrAlow-noise. cryogenic, high-electron-mobility transistors
    • Mar.
    • K.H. Ci. Duh et al., “UltrAlow-noise. cryogenic, high-electron-mobility transistors,” IEEE Trans. Electron Devices, vol. 35. pp. 249–256. Mar. 1988.
    • (1988) IEEE Trans. Electron Devices , vol.35 , pp. 249-256
    • Ci Duh, K.H.1
  • 25
    • 0024134941 scopus 로고
    • Cryogenic. HF.MT, low-noise-receivers for 1.3 to 43 GHz range
    • (New York, NY). May 1988.
    • S. Weinreb, M.W. Pospieszalski, and R. Norrod. “Cryogenic. HF.MT, low-noise-receivers for 1.3 to 43 GHz range.” in 1988 MTT-S Int. Microwave Symp. Dig. (New York, NY). May 1988. pp. 945–948.
    • (1988) MTT-S Int. Microwave Symp. Dig. , pp. 945-948
    • Weinreb, S.1    Pospieszalski, M.W.2    Norrod, R.3
  • 26
    • 0023252940 scopus 로고
    • Advances on HEMT technology and applications
    • (Las Vegas, NV). June 1987
    • P.M. Smith et al., “Advances on HEMT technology and applications,” in 1987 MTT-S Int. Microwave Symp. Dig. (Las Vegas, NV). June 1987, pp. 749–752.
    • (1987) MTT-S Int. Microwave Symp. Dig. , pp. 749-752
    • Smith, P.M.1
  • 27
    • 0022703116 scopus 로고
    • On the measurement of noise parameters of microwave two-ports
    • Apr.
    • M.W. Pospieszalski. “On the measurement of noise parameters of microwave two-ports.” IEEE Trans. Microwave Theory Tech., vol. MTT-34, pp. 456–458, Apr. 1986.
    • (1986) IEEE Trans. Microwave Theory Tech. , vol.34 MTT , pp. 456-458
    • Pospieszalski, M.W.1
  • 28
    • 84937741249 scopus 로고
    • Theory of noisy four poles
    • June
    • H. Rothe and W. Dahlke, “Theory of noisy four poles,” Proc. IRE. vol. 44, pp. 811–818, June 1956.
    • (1956) Proc. IRE. , vol.44 , pp. 811-818
    • Rothe, H.1    Dahlke, W.2
  • 29
    • 0015673173 scopus 로고
    • Changes in the four noise parameters due to general changes of linear two-port circuits
    • Oct.
    • K. Hartmann and M.J.O. Strutt, “Changes in the four noise parameters due to general changes of linear two-port circuits.” IEEE Trans. Electron Devices, vol. ED-20. pp. 874–877, Oct. 1973.
    • (1973) IEEE Trans. Electron Devices , vol.20 ED , pp. 874-877
    • Hartmann, K.1    Strutt, M.J.O.2
  • 30
    • 84937655995 scopus 로고
    • Wave representations of amplifier noise
    • Mar.
    • P. Penfield, “Wave representations of amplifier noise.” IRE Trans. Circuit Theory, vol. CT-9. pp. 84–86, Mar. 1962.
    • (1962) IRE Trans. Circuit Theory , vol.9 CT , pp. 84-86
    • Penfield, P.1
  • 31
    • 84941446177 scopus 로고
    • A computer-aided analysis routine including optimization for microwave circuits and their noise
    • Internal Report No. 217, July
    • D.L. Fenstermacher. “A computer-aided analysis routine including optimization for microwave circuits and their noise,” National Radio Astronomy Observation Electronics Div. Internal Report No. 217, July 1981.
    • (1981) National Radio Astronomy Observation Electronics Div.
    • Fenstermacher, D.L.1
  • 32
    • 2542423501 scopus 로고
    • Noise characterization of linear two-ports in terms of invariant parameters
    • June
    • J. Lange, “Noise characterization of linear two-ports in terms of invariant parameters,” IEEE]. Solid-State Circuits, vol. SC-2. pp. 37–40. June 1967.
    • (1967) IEEE]. Solid-State Circuits , vol.2 SC , pp. 37-40
    • Lange, J.1
  • 34
    • 36849128231 scopus 로고
    • Nyquist's and Thevenin's theorems generalized for nonreciprocal linear networks
    • May
    • R.Q. Twiss, “Nyquist's and Thevenin's theorems generalized for nonreciprocal linear networks.” J. Appl. Phys., vol. 26, no. 5, pp. 599–602, May 1955.
    • (1955) J. Appl. Phys. , vol.26 , Issue.5 , pp. 599-602
    • Twiss, R.Q.1
  • 35
    • 0016947365 scopus 로고
    • An efficient method for computer-aided noise analysis of linear amplifier networks
    • Apr.
    • H. Hillbrand and P. Russer, “An efficient method for computer-aided noise analysis of linear amplifier networks.” IEEE Trans. Circuits Syst., vol. CAS-23. pp. 235–238, Apr. 1976.
    • (1976) IEEE Trans. Circuits Syst. , vol.23 CAS , pp. 235-238
    • Hillbrand, H.1    Russer, P.2
  • 36
    • 0003038536 scopus 로고
    • Optimal noise performance of linear amplifiers
    • Aug.
    • H.A. Haus and R.B. Adler, “Optimal noise performance of linear amplifiers,” Proc. IRE, vol. 46, pp. 1517–1533, Aug. 1958.
    • (1958) Proc. IRE , vol.46 , pp. 1517-1533
    • Haus, H.A.1    Adler, R.B.2
  • 37
    • 84916592123 scopus 로고
    • Available power gain noise figure, and noise measure of two-ports and their graphical representations
    • June
    • H. Fukui, “Available power gain noise figure, and noise measure of two-ports and their graphical representations.” IEEE Trans. Circuit Theory, vol. CT-13, pp. 137–142, June 1966.
    • (1966) IEEE Trans. Circuit Theory , vol.13 CT , pp. 137-142
    • Fukui, H.1
  • 39
    • 0022419981 scopus 로고
    • Modelling frequency dependence of output inpedance of a microwave MESFET at low frcquencv
    • June
    • C. Camacho-Penalosa and C.S. Aitchison, “Modelling frequency dependence of output inpedance of a microwave MESFET at low frcquencv,” Electron. Eett., vol. 21. pp. 528–529, June 1985.
    • (1985) Electron. Eett. , vol.21 , pp. 528-529
    • Camacho-Penalosa, C.1    Aitchison, C.S.2
  • 41
    • 84941481104 scopus 로고
    • Extracting more accurate FET equivalent circuits
    • suppl. to MSX&CT., Oct.
    • E.W. Strid, “Extracting more accurate FET equivalent circuits,” Monolithic Technol., suppl. to MSX&CT. pp. 3–7, Oct. 1987.
    • (1987) Monolithic Technol. , pp. 3-7
    • Strid, E.W.1
  • 42
    • 84941540824 scopus 로고
    • Electronics Division Internal Report No. 250, National Radio Astronomy Observatory. Charlottesville. VA. Aug.
    • J. Granitinel. “1ARANT on the HP9816 computer.” Electronics Division Internal Report No. 250, National Radio Astronomy Observatory. Charlottesville. VA. Aug. 1984.
    • (1984) 1ARANT on the HP9816 computer.
    • Granitinel, J.1
  • 44
    • 0023545830 scopus 로고
    • Velocity fluctuation noise measurements on AlGa. As-GaAs interfaces
    • December
    • C.F. Whiteside. G. Bosnian, and H. Morkoc. “Velocity fluctuation noise measurements on AlGa. As-GaAs interfaces.” IEEE Trans. Electron Devices, vol. ED-34. pp. 2530–2533, December 1987.
    • (1987) IEEE Trans. Electron Devices , vol.34 ED , pp. 2530-2533
    • Whiteside, C.F.1    Bosnian, G.2    Morkoc, H.3
  • 45
    • 0020876980 scopus 로고
    • Noise performance of microwave HF.MT
    • (Boston. MA). June 1983.
    • K. Joshin et al., “Noise performance of microwave HF.MT.” in 1983 IEEE MTT-S Int. Microwave Symp. Dig. (Boston. MA). June 1983. pp. 563–565.
    • (1983) IEEE MTT-S Int. Microwave Symp. Dig. , pp. 563-565
    • Joshin, K.1
  • 46
    • 0024140381 scopus 로고
    • Distributed analysis of submicron MESFET noise properties
    • (New-York. NY). May 1988
    • W. Heinrich. “Distributed analysis of submicron MESFET noise properties.” in 1988 IEEE MTT-S Int. Microwave Symp. Dig. (New-York. NY). May 1988, pp. 327–330.
    • (1988) IEEE MTT-S Int. Microwave Symp. Dig. , pp. 327-330
    • Heinrich, W.1
  • 47
    • 0016042808 scopus 로고
    • Effect of source lead inductance on the noise figure of GaAs FET
    • Mar. (corr S. Iversen, Proc. IEEE. vol. 63. pp. 983-984, June 1975).
    • A. Anastassiou and M.J.O. Strutt. “Effect of source lead inductance on the noise figure of GaAs FET.” Proc. IEEE. vol. 62. pp. 406-408, Mar. 1974 (corr S. Iversen, Proc. IEEE. vol. 63. pp. 983–984, June 1975).
    • (1974) Proc. IEEE. , vol.62 , pp. 406-408
    • Anastassiou, A.1    Strutt, M.J.O.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.