Method for measuring noise parameters of microwave two-port

Electronics Letters

Volumn 34, Issue 13, 1998, Pages 1332-1333

  Lazaro A ^a   Pradell, L ^a   O'Callaghan, J M ^a  

^a UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; FREQUENCY DOMAIN ANALYSIS; MICROWAVE DEVICES; SPURIOUS SIGNAL NOISE;

MICROWAVE TWO PORT;

MICROSTRIP LINES;

EID: 0032089558     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19980942     Document Type: Article

References (8)

1. LANE, R.Q.: 'The determination of device noise parameters', Proc. IEEE, 1969, 57, pp. 1461-1462
2. CARUSO, G., and SANNINO, M.: 'Computer-aided determination of microwave two-port noise parameters', IEEE Trans. Microw. Theory Tech., 1978, 26, (9), pp. 639-642
3. ADAMIAN, A., and UHLIR, A.: 'A novel procedure for receiver noise characterisation', IEEE Trans. Instrum. Meas., 1973, 22, (6), pp. 181-182
4. DAVIDSON, A.C., LEAKE, B.W., and STRID, E.: 'Accuracy improvements in microwave noise parameter measurements', IEEE Trans. Microw. Theory Tech., 1989, 37, (12), pp. 1973-1978
5. O'CALLAGHAN, J.M., and MONDAL, J.P.: 'A vector approach for noise parameter fitting and selection of source admittances', IEEE Trans. Microw. Theory Tech., 1991, 37, (12), pp. 1376-1382
6. NPTS-26 System, Cascade-Microtech, Inc., 14255 SW Brigadoon, Beaverton, OR 97005
7. CROZAT, P., BOUTEX, C., CHAUBET, M., DANELON, V., SYLVESTRE, A., and VERNET, G.: '50 Ω noise measurements with full receiver calibration without tuner', Electron. Lett., 1996, 3, pp. 261-262
8. LÁZARO, A., PRADELL, L., BELTRÁN, A., and O'CALLAGHAN, J.M.: 'Direct extraction of all four transistor noise parameters from 50Ω noise figure measurements', Electron. Lett., 1998, 32, (3), pp. 289-291