On the Determination of Device Noise and Gain Parameters

Proceedings of the IEEE

Volumn 67, Issue 9, 1979, Pages 1364-1366

  Sannino, Mario ^a  

^a UNIVERSITY OF PALERMO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

NOISE, SPURIOUS SIGNAL;

EID: 0018518499     PISSN: 00189219     EISSN: 15582256     Source Type: Journal    
DOI: 10.1109/PROC.1979.11458     Document Type: Article

References (3)

1. R. Q. Lane, “The determination of device noise parameters,” Proc. IEEE (Lett), vol. 57, pp. 1461–1462, Aug. 1969.
2. IRE Standards on method of measuring noise in linear two-port, 1959, Proc. IRE, vol. 48, pp. 60–68, Jan. 1960.
3. R. Q. Lane. “A microwave noise and gain parameter test set,” in 1978 IEEE ISSCC Dig. Tech. Papers, pp. 172–173 and p. 274, Feb. 1978.