Dynamic and short-circuit power of CMOS gates driving lossless transmission lines

IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications

Volumn 46, Issue 8, 1999, Pages 950-961

  Ismail, Yehea I ^a,b   Friedman, Eby G ^a,b   Neves, Jose Luis ^a,b  

^a University of Rochester   (United States)

^b IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTRIC LINES; ELECTRIC LOSSES; ELECTRIC RESISTANCE; GATES (TRANSISTOR); INTERCONNECTION NETWORKS; SHORT CIRCUIT CURRENTS;

INDUCTANCE-CAPACITANCE TRANSMISSION LINES;

CMOS INTEGRATED CIRCUITS;

EID: 0032630123     PISSN: 10577122     EISSN: None     Source Type: Journal    
DOI: 10.1109/81.780376     Document Type: Article

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