A system for critical path analysis based on back annotation and distributed interconnect impedance models

Microelectronics Journal

Volumn 19, Issue 3, 1988, Pages 21-30

  Yacoub, G Y ^a   Pham, H ^a   Ma, M ^a   Friedman, E G ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATABASE SYSTEMS; ELECTRIC NETWORKS - COMPUTER AIDED ANALYSIS;

BACK ANNOTATION; CPU EFFICIENCY; CRITICAL PATH ANALYSIS; DESIGN FLEXIBILITY; INTERCONNECT IMPEDANCE; WORST CASE TIMING PATH;

INTEGRATED CIRCUITS, VLSI;

EID: 0024011654     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2692(88)80051-X     Document Type: Article

References (17)

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