Analysis of the Effects of Scaling on Interconnect Delay in ULSI Circuits

IEEE Transactions on Electron Devices

Volumn 40, Issue 3, 1993, Pages 591-597

  Bothra, Subhas ^a   Rogers, Boyd ^a   Kellam, Mark ^a   Osburn, Carlton M ^a  

^a MCNC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; ELECTRIC INSULATORS; ELECTRIC NETWORK ANALYSIS; SEMICONDUCTOR DEVICE MODELS;

ELECTROMIGRATION; INTERCONNECT DELAYS; RC DELAYS; SCALING EFFECTS;

ULSI CIRCUITS;

EID: 0027553273     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.199365     Document Type: Article

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