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Volumn 27, Issue 2, 1997, Pages 302-313

Silicon oxidation and oxynitridation in the ultrathin regime: Ion scattering studies

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0031506198     PISSN: 01039733     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review
Times cited : (5)

References (140)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.