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Journal of Applied Physics

Volumn 79, Issue 3, 1996, Pages 1583-1594

Oxide, interface, and border traps in thermal, N2O, and N2O-nitrided oxides

(2) Fleetwood, D M a Saks, N S b

a SANDIA NATIONAL LABORATORIES (United States)

b NAVAL RESEARCH LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000254929 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.361002 Document Type: Article

Times cited : (148)

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