Quantitative model of radiation induced charge trapping in SiO2

IEEE Transactions on Nuclear Science

Volumn 44, Issue 6 PART 1, 1997, Pages 1804-1809

  Conley Jr , J F ^a   Lenahan, P M ^a   Wallace, B D ^a,b   Cole, P ^a,b  

^a DYNAMICS RESEARCH CORPORATION   (United States)

^b The Pennsylvania State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COLOR CENTERS; ION BOMBARDMENT; MOSFET DEVICES; PARAMAGNETIC RESONANCE; SILICA; STATISTICAL MECHANICS;

RADIATION INDUCED CHARGE TRAPPING;

RADIATION EFFECTS;

EID: 0031343571     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.658946     Document Type: Article

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