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Volumn 30, Issue 6, 1983, Pages 4602-4604
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Microstructural variations in radiation hard and soft oxides observed through electron spin resonance
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Author keywords
[No Author keywords available]
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Indexed keywords
MAGNETIC RESONANCE;
SEMICONDUCTOR DEVICES, MOS - RADIATION EFFECTS;
DIELECTRIC MATERIALS;
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EID: 0020910298
PISSN: 00189499
EISSN: 15581578
Source Type: Journal
DOI: 10.1109/TNS.1983.4333179 Document Type: Article |
Times cited : (66)
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References (21)
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