Spatial dependence of trapped holes determined from tunneling analysis and measured annealing

IEEE Transactions on Nuclear Science

Volumn 33, Issue 6, 1986, Pages 1203-1209

  Oldham, T R ^a   Lelis, A J ^a   McLean, F B ^a  

^a U S ARMY RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84939057367     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1986.4334579     Document Type: Article

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